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Volumn 14, Issue 2, 1996, Pages 901-905

Scanning force microscopy in the dynamic mode using microfabricated capacitive sensors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001453196     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589171     Document Type: Article
Times cited : (98)

References (13)
  • 8
    • 5544306801 scopus 로고
    • Forces in Scanning Probe Methods, edited by H.-J. Guntherodt et al.
    • N. Blanc, J. Brugger, and N. F. de Rooij, in Forces in Scanning Probe Methods, edited by H.-J. Guntherodt et al. [NATO ASI Ser. E: Appl. Sci. 286, 79 (1995)].
    • (1995) NATO ASI Ser. E: Appl. Sci. , vol.286 , pp. 79
    • Blanc, N.1    Brugger, J.2    De Rooij, N.F.3
  • 10
    • 5544325566 scopus 로고
    • M.S. thesis, University of Michigan at Ann Arbor
    • M. W. Putty, M.S. thesis, University of Michigan at Ann Arbor, 1988.
    • (1988)
    • Putty, M.W.1
  • 13
    • 36449005197 scopus 로고
    • T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991); U. Dürig, O. Züger, and A. Stalder, ibid. 72, 1778 (1992).
    • (1992) J. Appl. Phys. , vol.72 , pp. 1778
    • Dürig, U.1    Züger, O.2    Stalder, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.