Nanoscale resolution microchannel flow velocimetry by atomic force microscopy

Applied Physics Letters

Volumn 89, Issue 15, 2006, Pages

  Piorek, Brian ^a,b   Mechler, Ádám ^b,c   Lal, Ratnesh ^b   Freudenthal, Patrick ^a   Meinhart, Carl ^a   Banerjee, Sanjoy ^a  

^a University of California   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF SZEGED   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

MICROCHANNEL FLOWS; PARTICLE IMAGE VELOCITY (PIV); VELOCITY PROFILE;

ATOMIC FORCE MICROSCOPY; CRYSTAL WHISKERS; POLYSTYRENES; SEMICONDUCTOR QUANTUM DOTS; VELOCITY MEASUREMENT;

NANOTECHNOLOGY;

EID: 33750015762     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2358966     Document Type: Article

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