Multi-mode noise analysis of cantilevers for scanning probe microscopy

Journal of Applied Physics

Volumn 81, Issue 6, 1997, Pages 2480-2487

  Salapaka, M V ^a   Bergh, H S ^a   Lai, J ^a   Majumdar, A ^b   McFarland, E ^a  

^a University of California   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001550969     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363955     Document Type: Article

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