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Journal of Applied Physics

Volumn 81, Issue 6, 1997, Pages 2480-2487

Multi-mode noise analysis of cantilevers for scanning probe microscopy

(5) Salapaka, M V a Bergh, H S a Lai, J a Majumdar, A b McFarland, E a

a University of California at Santa Barbara (United States)

b UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001550969 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.363955 Document Type: Article

Times cited : (131)

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