Micromechanics: A toolbox for femtoscale science: "Towards a laboratory on a tip"

Microelectronic Engineering

Volumn 35, Issue 1-4, 1997, Pages 373-379

  Berger, R ^a,b   Gerber, Ch ^a   Lang, H P ^a,b   Gimzewski, J K ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CALORIMETERS; CHEMICAL REACTIONS; CRYSTALS; ELECTROCHEMISTRY; MICROELECTROMECHANICAL DEVICES; PHASE TRANSITIONS; SENSORS; SPECTROMETERS; THERMOANALYSIS; THERMOCOUPLES; THIN FILMS;

BIMETALLIC METHOD; MICROMECHANICAL DEVICES; NANOSCALE SCIENCE METHOD; OPTICAL ABSORPTION SPECTROMETER; SCANNING FORCE MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 0031072046     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(96)00201-8     Document Type: Article

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