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Volumn 245, Issue 7, 2008, Pages 1281-1297

Identification of intrinsic defects in SiC: Towards an understanding of defect aggregates by combining theoretical and experimental approaches

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Indexed keywords


EID: 55449107763     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200844048     Document Type: Review
Times cited : (46)

References (73)
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    • M. Bockstedte, A. Marini, A. Gali, O. Pankratov, and A. Rubio, Mater. Sci. Forum, in print (2008).
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  • 36
    • 55449112399 scopus 로고    scopus 로고
    • V. S. Vainer and V. A. Il'in, Sov. Phys. Solid State 23, 2126 (1981).
    • V. S. Vainer and V. A. Il'in, Sov. Phys. Solid State 23, 2126 (1981).
  • 61
    • 0242460513 scopus 로고    scopus 로고
    • F. H. C. Carlsson, S. G. Sridhara, A. Hallén, and J. P. Bergman, and E. Janzén, Mater. Sci. Forum 433-436, 345 (2003).
    • F. H. C. Carlsson, S. G. Sridhara, A. Hallén, and J. P. Bergman, and E. Janzén, Mater. Sci. Forum 433-436, 345 (2003).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.