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Volumn 75, Issue 8, 2007, Pages

Clustering of vacancy defects in high-purity semi-insulating SiC

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EID: 33846979414     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.085208     Document Type: Article
Times cited : (33)

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