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Volumn 308-310, Issue , 2001, Pages 656-659

Interstitials in SiC: A model for the DII center

Author keywords

DII center; LVM; Point defects; Silicon carbide

Indexed keywords

BINDING ENERGY; CHEMICAL BONDS; PHONONS; PHOTOLUMINESCENCE; POINT DEFECTS;

EID: 17044455764     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(01)00782-7     Document Type: Article
Times cited : (22)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.