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Volumn 63, Issue 20, 2001, Pages 2012011-2012014
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Carbon vacancy-related defect in 4H and 6H SiC
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
SILICON;
ARTICLE;
ELECTRON;
ELECTRON SPIN RESONANCE;
HIGH TEMPERATURE PROCEDURES;
MAGNETIC FIELD;
MATHEMATICAL PARAMETERS;
SEMICONDUCTOR;
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EID: 0034888268
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/physrevb.63.201201 Document Type: Article |
Times cited : (122)
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References (17)
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