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Volumn 46, Issue 2, 1999, Pages 310-319

Extremely low-noise performance of GaAs MESFET's with wide-head T-shaped gate

Author keywords

Gaas; Gate resistance; MESFET; Noise performance; Semiconductor device fabrication

Indexed keywords

CAPACITANCE; ELECTRIC RESISTANCE; GATES (TRANSISTOR); SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0033079811     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.740895     Document Type: Article
Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.