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Volumn 39, Issue 7, 1991, Pages 1243-1247

Equivalent-Circuit Parameter Extraction for Cold Gaas Mesfet's

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS--EQUIVALENT CIRCUITS; SEMICONDUCTING GALLIUM ARSENIDE; TRANSISTORS, FIELD EFFECT;

EID: 0026185658     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.85396     Document Type: Article
Times cited : (90)

References (15)
  • 2
    • 0024048518 scopus 로고
    • A new method for determining FET small-signal equivalent circuits
    • July
    • G. Dambrine, A. Cappy, F. Heliodore, and E. Playez, “A new method for determining FET small-signal equivalent circuits,” IEEE Trans. Microwave Theory Tech., vol. 36, pp. 1151–1159, July 1988.
    • (1988) IEEE Trans. Microwave Theory Tech. , vol.36 , pp. 1151-1159
    • Dambrine, G.1    Cappy, A.2    Heliodore, F.3    Playez, E.4
  • 4
    • 0024106644 scopus 로고
    • Application of RF wafer probing to MESFET modeling
    • Nov
    • R. Vogel, “Application of RF wafer probing to MESFET modeling,” Microwave J., vol. 31, pp. 153–162, Nov. 1988.
    • (1988) Microwave J. , vol.31 , pp. 153-162
    • Vogel, R.1
  • 5
    • 0018442981 scopus 로고
    • Determination of the basic device parameters of a GaAs MESFET
    • H. Fukui, “Determination of the basic device parameters of a GaAs MESFET,” Bell Syst. Tech. J., vol. 58, pp. 771–797, 1979.
    • (1979) Bell Syst. Tech. J. , vol.58 , pp. 771-797
    • Fukui, H.1
  • 7
    • 84941431641 scopus 로고    scopus 로고
    • Patterson NJ
    • SuperCompact is a trademark of Compact Software Inc., Patterson NJ.
  • 10
    • 0025402307 scopus 로고
    • Source and drain resistance studies of GaAs MESFET’s
    • Mar
    • Y. T. Tsai and T. A. Grotjohn, “Source and drain resistance studies of GaAs MESFET’s,” IEEE Trans. Electron Devices, vol. 37, pp. 775–781, Mar. 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 775-781
    • Tsai, Y.T.1    Grotjohn, T.A.2
  • 11
    • 0023294433 scopus 로고
    • Relationship between measured and intrinsic transconductances of FET’s
    • Feb
    • S. Y. Chou and D. A. Antoniadis, “Relationship between measured and intrinsic transconductances of FET’s,” IEEE Trans. Electron Devices, vol. ED-34, pp. 448–450, Feb. 1987.
    • (1987) IEEE Trans. Electron Devices , vol.ED-34 , pp. 448-450
    • Chou, S.Y.1    Antoniadis, D.A.2
  • 12
    • 84941442362 scopus 로고
    • Simplified GaAs MESFET model
    • R. A. Minasian, “Simplified GaAs MESFET model,” Electron. Lett., vol. 13, pp. 550–-553 1977.
    • (1977) Electron. Lett. , vol.13 , pp. 550-553
    • Minasian, R.A.1
  • 13
    • 0026190496 scopus 로고    scopus 로고
    • Measurement and analysis of GaAs MESFET parasitic capacitances
    • this issue
    • R. Anholt and S. Swirhun, “Measurement and analysis of GaAs MESFET parasitic capacitances,” pp. 1247–1251, this issue.
    • Anholt, R.1    Swirhun, S.2
  • 15
    • 36549102250 scopus 로고
    • Schottky barrier profiling techniques in semiconductors
    • Feb
    • D. C. Look, “Schottky barrier profiling techniques in semiconductors,” J. Appl. Phys., vol. 57, pp. 377–383 Feb. 1985.
    • (1985) J. Appl. Phys. , vol.57 , pp. 377-383
    • Look, D.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.