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Volumn 16, Issue 6, 1995, Pages 271-273

Ultra Low Noise Characteristics of AIGaAs/InGaAs/GaAs Pseudomorphic HEMT's with Wide Head T-Shaped Gate

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM GALLIUM ARSENIDE; DOSE SPLIT ELECTRON BEAM LITHOGRAPHY; GATE FOOTPRINT; GATE HEAD LENGTH; INDIUM GALLIUM ARSENIDE; LOW GATE RESISTANCE;

EID: 0029322367     PISSN: 07413106     EISSN: 15580563     Source Type: Journal    
DOI: 10.1109/55.790732     Document Type: Article
Times cited : (50)

References (8)
  • 1
    • 0027910987 scopus 로고
    • Super low noise pseudomorphic InGaAs channel InP HEMTs
    • T. Hwang, P. Chye, and P. Gregory, “Super low noise pseudomorphic InGaAs channel InP HEMTs,” Electron. Lett., vol. 29, pp. 10-11, 1993.
    • (1993) Electron. Lett. , vol.29 , pp. 10-11
    • Hwang, T.1    Chye, P.2    Gregory, P.3
  • 4
    • 0022083741 scopus 로고
    • Electron-beam fabrication of GaAs low-noise MESFET's using a new trilayer resist technique
    • P. C. Chao, P. M. Smith, S. C. Palmateer, and J. C. M. Hwang, “Electron-beam fabrication of GaAs low-noise MESFET's using a new trilayer resist technique,” IEEE Trans. Electron Devices, vol. ED-32, pp. 1042–1046, 1985.
    • (1985) IEEE Trans. Electron Devices , vol.32 , pp. 1042-1046
    • Chao, P.C.1    Smith, P.M.2    Palmateer, S.C.3    Hwang, J.C.M.4
  • 5
    • 0000881669 scopus 로고
    • Electron beam lithography and resist processing for the fabrication of T-gate structures
    • R. C. Tiberio, J. M, Limber, G. J. Galbin, and E. D. Wolf. “Electron beam lithography and resist processing for the fabrication of T -gate structures,” in Proc. SPIE, vol. 1089, pp. 124–131, 1989.
    • (1989) Proc. SPIE , vol.1089 , pp. 124-131
    • Tiberio, R.C.1    Limber, J.M.2    Galbin, G.J.3    Wolf, E.D.4
  • 6
    • 84936902954 scopus 로고    scopus 로고
    • Dose split method for T-shaped gate super low noise HEMTs,” submitted to Electron Lett
    • J. H. Lee, S. S. Choi, H. S. Yoon, C. S. Park, and H. M. Park, “Dose split method for T -shaped gate super low noise HEMTs,” submitted to Electron Lett., 1994.
    • Lee, J.H.1    Choi, S.S.2    Yoon, H.S.3    Park, C.S.4    Park, H.M.5
  • 7
    • 0018490967 scopus 로고
    • Optimal noise figure of microwave GaAs MESFET's
    • H. Fukui, “Optimal noise figure of microwave GaAs MESFET's,” IEEE Trans. Electron Device., vol. ED-26, pp, 1032–1037, 1979.
    • (1979) IEEE Trans. Electron Device. , vol.ED-26 , pp. 1032-1037
    • Fukui, H.1
  • 8
    • 0023844609 scopus 로고
    • Optimal noise figure of microwave GaAs
    • A. Cappy, “Optimal noise figure of microwave GaAs,” IEEE Trans. Microwave Theory and Tech., vol. 36, pp. 1-10, 1988
    • (1988) IEEE Trans. Microwave Theory andTech. , vol.36 , pp. 1-10
    • Cappy, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.