-
1
-
-
0025174425
-
W-band InGaAs HEMT low-noise amplifiers
-
May
-
K. H. G. Duh, P. C. Chao, P. Ho, A. Tessmer, S. M. J. Liu, M. Y. Kao, P. M. Smith, and J. M. Ballingall, “W-band InGaAs HEMT low-noise amplifiers,” IEEE MTT-S Dig., pp. 595–598, May 1990.
-
(1990)
IEEE MTT-S Dig.
, pp. 595-598
-
-
Duh, K.H.G.1
Chao, P.C.2
Ho, P.3
Tessmer, A.4
Liu, S.M.J.5
Kao, M.Y.6
Smith, P.M.7
Ballingall, J.M.8
-
2
-
-
0025588053
-
94-GHz 0.1-um T-gate low-noise pseudomorphic InGaAs HEMT's
-
Dec.
-
K. L. Tan, R. M. Dia, D. C. Streit, T. Lin, T. Q. Trinh, A. C. Han, P. H. Liu, P. M. D. Chow, and H. C. Yen, “94-GHz 0.1-um T-gate low-noise pseudomorphic InGaAs HEMT's,” IEEE Electron Device Lett., vol. 11, no. 12, pp. 585–587, Dec. 1990.
-
(1990)
IEEE Electron Device Lett.
, vol.11
, Issue.12
, pp. 585-587
-
-
Tan, K.L.1
Dia, R.M.2
Streit, D.C.3
Lin, T.4
Trinh, T.Q.5
Han, A.C.6
Liu, P.H.7
Chow, P.M.D.8
Yen, H.C.9
-
3
-
-
84948599503
-
Noise performance of AlGaAs-InGaAs HEMT's with 0.15 um T-shaped W-Six gate at cryogenic temperature
-
Sept.
-
Y. Mimino, K. Joshin, S. Ohmura, and Y. Hirachi, “Noise performance of AlGaAs-InGaAs HEMT's with 0.15 um T-shaped W-Six gate at cryogenic temperature,” in 3rd Asia-Pacific Microwave Conf. Proc., Sept. 1990, pp. 645–648.
-
(1990)
3rd Asia-Pacific Microwave Conf. Proc.
, pp. 645-648
-
-
Mimino, Y.1
Joshin, K.2
Ohmura, S.3
Hirachi, Y.4
-
4
-
-
84948611063
-
Fabrication of a 80 nm self-aligned T-gate AlInAs-GalnAs HEMT
-
San Francisco, CA, Paper 19.1, Dec.
-
L. D. Nguyen, L. M. Jelloian, M. Thompson, and M. Lui, “Fabrication of a 80 nm self-aligned T-gate AlInAs-GalnAs HEMT,” 1990 IEEE IEDM, San Francisco, CA, Paper 19.1, Dec. 1990.
-
(1990)
1990 IEEE IEDM
-
-
Nguyen, L.D.1
Jelloian, L.M.2
Thompson, M.3
Lui, M.4
-
5
-
-
84948589493
-
Extremely high gain, low-noise InAlAs-InGaAs HEMT grown by molecular beam epitaxy
-
San Francisco, CA, Paper 8.5, Dec. 1988
-
P. Ho, P. C. Chao, K. H. G. Duh, A. A. Jabra, J. M. Ballingall, and P. M. Smith, “Extremely high gain, low-noise InAlAs-InGaAs HEMT grown by molecular beam epitaxy,” 1988 IEEE IEDM, San Francisco, CA, Paper 8.5, Dec. 1988.
-
1988 IEEE IEDM
-
-
Ho, P.1
Chao, P.C.2
Duh, K.H.G.3
Jabra, A.A.4
Ballingall, J.M.5
Smith, P.M.6
-
6
-
-
0025545667
-
Microwave InAlAs-InGaAs-InP HEMT's: Status and applications
-
Apr., Denver, CO
-
P. M. Smith, P. C. Chao, P. Ho, K. H. G. Duh, M. Y. Kao, J. M. Ballingall, S. T. Allen, and A. Tessmer, “Microwave InAlAs-InGaAs-InP HEMT's: Status and applications,” 2nd Int. Conf. Indium Phosphide and Related Materials, Denver, CO, Apr. 1990 pp. 39–43.
-
(1990)
2nd Int. Conf. Indium Phosphide and Related Materials
, pp. 39-43
-
-
Smith, P.M.1
Chao, P.C.2
Ho, P.3
Duh, K.H.G.4
Kao, M.Y.5
Ballingall, J.M.6
Allen, S.T.7
Tessmer, A.8
-
7
-
-
0014638211
-
The determination of device noise parameters
-
Aug.
-
R. Q. Lang, “The determination of device noise parameters,” Proc. IEEE, vol. 57, pp. 1462–1462, Aug. 1969.
-
(1969)
Proc. IEEE
, vol.57
, pp. 1462
-
-
Lang, R.Q.1
-
8
-
-
0024888749
-
Accuracy improvements in microwave noise parameter measurements
-
Dec.
-
A. C. Davidson, B. W. Leake, and E. Strid, “Accuracy improvements in microwave noise parameter measurements,” IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1973–1978, Dec. 1989.
-
(1989)
IEEE Trans. Microwave Theory Tech.
, vol.37
, pp. 1973-1978
-
-
Davidson, A.C.1
Leake, B.W.2
Strid, E.3
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