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Volumn 1, Issue 5, 1991, Pages 114-116

A Super Low-Noise 0.1 um T-Gate InA1 As-InGaAs-InP HEMT

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS, MICROWAVE; NOISE, SPURIOUS SIGNAL; SEMICONDUCTING GALLIUM ARSENIDE--APPLICATIONS; SEMICONDUCTING INDIUM COMPOUNDS; TELECOMMUNICATION LINKS, MICROWAVE;

EID: 0026152278     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.89081     Document Type: Article
Times cited : (99)

References (8)
  • 3
    • 84948599503 scopus 로고
    • Noise performance of AlGaAs-InGaAs HEMT's with 0.15 um T-shaped W-Six gate at cryogenic temperature
    • Sept.
    • Y. Mimino, K. Joshin, S. Ohmura, and Y. Hirachi, “Noise performance of AlGaAs-InGaAs HEMT's with 0.15 um T-shaped W-Six gate at cryogenic temperature,” in 3rd Asia-Pacific Microwave Conf. Proc., Sept. 1990, pp. 645–648.
    • (1990) 3rd Asia-Pacific Microwave Conf. Proc. , pp. 645-648
    • Mimino, Y.1    Joshin, K.2    Ohmura, S.3    Hirachi, Y.4
  • 4
    • 84948611063 scopus 로고
    • Fabrication of a 80 nm self-aligned T-gate AlInAs-GalnAs HEMT
    • San Francisco, CA, Paper 19.1, Dec.
    • L. D. Nguyen, L. M. Jelloian, M. Thompson, and M. Lui, “Fabrication of a 80 nm self-aligned T-gate AlInAs-GalnAs HEMT,” 1990 IEEE IEDM, San Francisco, CA, Paper 19.1, Dec. 1990.
    • (1990) 1990 IEEE IEDM
    • Nguyen, L.D.1    Jelloian, L.M.2    Thompson, M.3    Lui, M.4
  • 5
    • 84948589493 scopus 로고    scopus 로고
    • Extremely high gain, low-noise InAlAs-InGaAs HEMT grown by molecular beam epitaxy
    • San Francisco, CA, Paper 8.5, Dec. 1988
    • P. Ho, P. C. Chao, K. H. G. Duh, A. A. Jabra, J. M. Ballingall, and P. M. Smith, “Extremely high gain, low-noise InAlAs-InGaAs HEMT grown by molecular beam epitaxy,” 1988 IEEE IEDM, San Francisco, CA, Paper 8.5, Dec. 1988.
    • 1988 IEEE IEDM
    • Ho, P.1    Chao, P.C.2    Duh, K.H.G.3    Jabra, A.A.4    Ballingall, J.M.5    Smith, P.M.6
  • 7
    • 0014638211 scopus 로고
    • The determination of device noise parameters
    • Aug.
    • R. Q. Lang, “The determination of device noise parameters,” Proc. IEEE, vol. 57, pp. 1462–1462, Aug. 1969.
    • (1969) Proc. IEEE , vol.57 , pp. 1462
    • Lang, R.Q.1
  • 8
    • 0024888749 scopus 로고
    • Accuracy improvements in microwave noise parameter measurements
    • Dec.
    • A. C. Davidson, B. W. Leake, and E. Strid, “Accuracy improvements in microwave noise parameter measurements,” IEEE Trans. Microwave Theory Tech., vol. 37, pp. 1973–1978, Dec. 1989.
    • (1989) IEEE Trans. Microwave Theory Tech. , vol.37 , pp. 1973-1978
    • Davidson, A.C.1    Leake, B.W.2    Strid, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.