SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials

Surface and Interface Analysis

Volumn 42, Issue 10-11, 2010, Pages 1612-1615

  Matsuo, Jiro ^a,b   Ninomiya, Satoshi ^a,b   Yamada, Hideaki ^a   Ichiki, Kazuya ^a   Wakamatsu, Yoshinobu ^a   Hada, Masaki ^a   Seki, Toshio ^a,b   Aoki, Takaaki ^a,b  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Cluster ion beam; Molecular depth profiling; SIMS; Swift heavy ion beam

Indexed keywords

ANIMAL CELLS; CLUSTER ION BEAMS; CLUSTER IONS; HIGH ENERGY; KEY FACTORS; MOLECULAR DEPTH PROFILING; ORGANIC MATERIALS; ORGANIC SEMICONDUCTOR; PRIMARY BEAMS; SIMS; SWIFT HEAVY IONS;

BEAM PLASMA INTERACTIONS; BIOLOGICAL MATERIALS; HEAVY IONS; INERTIAL CONFINEMENT FUSION; ION BEAMS; ION BOMBARDMENT;

DEPTH PROFILING;

EID: 78449275839     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3585     Document Type: Conference Paper

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