Integration of SIMS into a general purpose IBA data analysis code

AIP Conference Proceedings

Volumn 1336, Issue , 2011, Pages 281-285

  Barradas, N P ^a,b   Likonen, J ^c   Alves, E ^a,b   Alves, L C ^a,b   Coad, P ^d   Hakola, A ^c   Widdowson, A ^d  

^a INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^b UNIVERSITY OF LISBON   (Portugal)

^c ASSOCIATION EURATOM TEKES   (Finland)

^d Culham Centre for Fusion Energy   (United Kingdom)

Author keywords

Ion beam analysis; NDF; Rutherford backscattering; SIMS

Indexed keywords

EID: 79960116224     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3586104     Document Type: Conference Paper

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