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Volumn 89, Issue 26, 2006, Pages
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Probing adsorption sites on thin oxide films by dynamic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
ATOMIC FORCE MICROSCOPY;
CRYSTAL ORIENTATION;
FILM GROWTH;
IMAGE RECONSTRUCTION;
LOW TEMPERATURE EFFECTS;
MAGNESIA;
NATURAL FREQUENCIES;
ULTRAHIGH VACUUM;
ATOMIC SCALE INFORMATION;
CLUSTERS;
DRIFT REDUCTION;
DYNAMIC FORCE MICROSCOPY;
THIN FILMS;
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EID: 33846075733
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2424432 Document Type: Article |
Times cited : (55)
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References (17)
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