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Volumn 89, Issue 26, 2006, Pages

Probing adsorption sites on thin oxide films by dynamic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; FILM GROWTH; IMAGE RECONSTRUCTION; LOW TEMPERATURE EFFECTS; MAGNESIA; NATURAL FREQUENCIES; ULTRAHIGH VACUUM;

EID: 33846075733     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2424432     Document Type: Article
Times cited : (55)

References (17)
  • 10
    • 33846050728 scopus 로고    scopus 로고
    • Nanosurf AG, Grammetstrasse 14, CH-4410 Liestal, Swiss (2006)
    • Nanosurf AG, Grammetstrasse 14, CH-4410 Liestal, Swiss (2006).
  • 12
    • 33846114055 scopus 로고    scopus 로고
    • Nanotec Electronica, Centro Empresarial Euronova 3, Ronda de Poniente, 2, Edificio 2-1a Planta-Oficina A, 28760 Tres Cantos (Madrid), Spain (2006b)
    • Nanotec Electronica, Centro Empresarial Euronova 3, Ronda de Poniente, 2, Edificio 2-1a Planta-Oficina A, 28760 Tres Cantos (Madrid), Spain (2006b).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.