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Volumn 272, Issue 5265, 1996, Pages 1158-1161

Nanotribology and nanofabrication of MoO3 structures by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001075932     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.272.5265.1158     Document Type: Article
Times cited : (232)

References (28)
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    • Amontons, G.1
  • 4
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    • I. L. Singer, J. Vac. Sci. Technol. A12, 2605 (1994); B. Bhushan, J. N. Israelachvili, U. Landman, Nature 374, 607 (1995).
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    • N. A. Burnham, D. D, Dominguez, R. L. Mowery, R. J. Colton, ibid. 64, 1931 (1990); G. S. Blackman, C. M. Mate, M. R. Philpott, ibid. 65, 2270 (1990); G. J. German et al., J. Appl. Phys. 73, 163 (1993).
    • (1990) Phys. Rev. Lett. , vol.65 , pp. 2270
    • Blackman, G.S.1    Mate, C.M.2    Philpott, M.R.3
  • 9
    • 0000726261 scopus 로고
    • N. A. Burnham, D. D, Dominguez, R. L. Mowery, R. J. Colton, ibid. 64, 1931 (1990); G. S. Blackman, C. M. Mate, M. R. Philpott, ibid. 65, 2270 (1990); G. J. German et al., J. Appl. Phys. 73, 163 (1993).
    • (1993) J. Appl. Phys. , vol.73 , pp. 163
    • German, G.J.1
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    • 0000406346 scopus 로고
    • Y. Kim and C. M. Lieber, Science 257, 375 (1992); Y. Kim, thesis, Harvard University (1993).
    • (1992) Science , vol.257 , pp. 375
    • Kim, Y.1    Lieber, C.M.2
  • 17
    • 0000406346 scopus 로고
    • thesis, Harvard University
    • Y. Kim and C. M. Lieber, Science 257, 375 (1992); Y. Kim, thesis, Harvard University (1993).
    • (1993)
    • Kim, Y.1
  • 23
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    • note
    • 3 nanocrystals.
  • 24
    • 4243185978 scopus 로고    scopus 로고
    • note
    • Friction for macroscopic systems is commonly expressed in a load-dependent form, F = μL, where L is the load and μ is the phenomenological coefficient of friction. In this expression, the friction is apparently independent of the contact area A; in reality, as L is increased between two rough surfaces, the contact area increases. Hence, F = sA represents a more microscopic representation of friction if the contact area is known at the atomic level.
  • 26
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    • R. Lüthi et al., Science 266, 1979 (1994).
    • (1994) Science , vol.266 , pp. 1979
    • Lüthier, R.1
  • 27
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    • Wiley, New York
    • K. E Drexler, Nanosystems (Wiley, New York, 1992), p. 364.
    • (1992) Nanosystems , pp. 364
    • Drexler, K.E.1
  • 28
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    • Supported by the Air Force Office of Scientific Research (F49620-94-1-0010)
    • Supported by the Air Force Office of Scientific Research (F49620-94-1-0010).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.