Non-contact AFM images measured on Si(111)√3 × √3-Ag and Ag(111) surfaces

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 456-461

  Sugawara, Y ^a   Minobe, T ^a   Orisaka, S ^a   Uchihashi, T ^a   Tsukamoto, T ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; SEMICONDUCTING SILICON; SILVER; SURFACE STRUCTURE; VAN DER WAALS FORCES;

CHEMICAL BONDING INTERACTION; COULOMB INTERACTION; PHYSICAL BONDING INTERACTION;

ATOMIC FORCE MICROSCOPY;

EID: 0032662935     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199905/06)27:5/6<456::aid-sia536>3.0.co;2-i     Document Type: Article

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