Vertical and lateral force mapping on the Si (111) - (7×7) surface by dynamic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 19, 2008, Pages

  Sugimoto, Yoshiaki ^a   Namikawa, Takashi ^a   Miki, Koutaro ^a   Abe, Masayuki ^a,b   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 43949086556     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.195424     Document Type: Article

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