-
1
-
-
79951820742
-
Current status and future trends in silicon power devices
-
13.11.11-13.11.14
-
[1] Hower, P.L., Pendharkar, S., Efland, T., Current status and future trends in silicon power devices. Electron Devices Meeting (IEDM), 2010 IEEE International, 2010 13.11.11-13.11.14.
-
(2010)
Electron Devices Meeting (IEDM), 2010 IEEE International
-
-
Hower, P.L.1
Pendharkar, S.2
Efland, T.3
-
2
-
-
84880731411
-
SiC power devices - present status, applications and future perspective
-
[2] Ostling, M., Ghandi, R., Zetterling, C.M., SiC power devices - present status, applications and future perspective. Proceedings of the International Symposium on Power Semiconductor Devices and ICs, 2011, 10–15.
-
(2011)
Proceedings of the International Symposium on Power Semiconductor Devices and ICs
, pp. 10-15
-
-
Ostling, M.1
Ghandi, R.2
Zetterling, C.M.3
-
3
-
-
84861795573
-
A review of GaN on SiC high electron-mobility power transistors and MMICs
-
[3] Pengelly, R.S., Wood, S.M., Milligan, J.W., Sheppard, S.T., Pribble, W.L., A review of GaN on SiC high electron-mobility power transistors and MMICs. IEEE Trans. Microw. Theory Tech. 60 (2012), 1764–1783.
-
(2012)
IEEE Trans. Microw. Theory Tech.
, vol.60
, pp. 1764-1783
-
-
Pengelly, R.S.1
Wood, S.M.2
Milligan, J.W.3
Sheppard, S.T.4
Pribble, W.L.5
-
4
-
-
4444315791
-
Thermal performance and microstructure of lead versus lead-free solder die attach interface in power device packages
-
[4] Stinson-Bagby, K., Huff, D., Katsis, D., Van Wyk, D., Lu, G.Q., Thermal performance and microstructure of lead versus lead-free solder die attach interface in power device packages. IEEE International Symposium on Electronics and the Environment, 2004, 27–32.
-
(2004)
IEEE International Symposium on Electronics and the Environment
, pp. 27-32
-
-
Stinson-Bagby, K.1
Huff, D.2
Katsis, D.3
Van Wyk, D.4
Lu, G.Q.5
-
5
-
-
27644447088
-
Isothermal and thermal cycling aging on IMC growth rate in lead-free and lead-based solder interface
-
[5] Xu, L., Pang, J.H.L., Prakash, K.H., Low, T.H., Isothermal and thermal cycling aging on IMC growth rate in lead-free and lead-based solder interface. IEEE Trans. Compon. Packag. Technol. 28 (2005), 408–414.
-
(2005)
IEEE Trans. Compon. Packag. Technol.
, vol.28
, pp. 408-414
-
-
Xu, L.1
Pang, J.H.L.2
Prakash, K.H.3
Low, T.H.4
-
6
-
-
0035415632
-
Correlation between intermetallic thickness and roughness during solder reflow
-
[6] Zuruzi, A.S., Lahiri, S.K., Burman, P., Siow, K.S., Correlation between intermetallic thickness and roughness during solder reflow. J. Electron. Mater. 30 (2001), 997–1000.
-
(2001)
J. Electron. Mater.
, vol.30
, pp. 997-1000
-
-
Zuruzi, A.S.1
Lahiri, S.K.2
Burman, P.3
Siow, K.S.4
-
7
-
-
78651103851
-
Die bonding for a nitride light-emitting diode by low-temperature sintering of micrometer size silver particles
-
[7] Kuramoto, M., Ogawa, S., Niwa, M., Kim, K.S., Suganuma, K., Die bonding for a nitride light-emitting diode by low-temperature sintering of micrometer size silver particles. IEEE Trans. Compon. Packag. Technol. 33 (2010), 801–808.
-
(2010)
IEEE Trans. Compon. Packag. Technol.
, vol.33
, pp. 801-808
-
-
Kuramoto, M.1
Ogawa, S.2
Niwa, M.3
Kim, K.S.4
Suganuma, K.5
-
8
-
-
84859805503
-
New silver paste for die-attaching ceramic light-emitting diode packages
-
[8] Kuramoto, M., Ogawa, S., Niwa, M., Kim, K.S., Suganuma, K., New silver paste for die-attaching ceramic light-emitting diode packages. IEEE Trans. Compon. Packag. Technol. 1 (2011), 653–659.
-
(2011)
IEEE Trans. Compon. Packag. Technol.
, vol.1
, pp. 653-659
-
-
Kuramoto, M.1
Ogawa, S.2
Niwa, M.3
Kim, K.S.4
Suganuma, K.5
-
9
-
-
84855885291
-
Low-temperature low-pressure die attach with hybrid silver particle paste
-
[9] Suganuma, K., Sakamoto, S., Kagami, N., Wakuda, D., Kim, K.S., Nogi, M., Low-temperature low-pressure die attach with hybrid silver particle paste. Microelectron. Reliab. 52 (2012), 375–380.
-
(2012)
Microelectron. Reliab.
, vol.52
, pp. 375-380
-
-
Suganuma, K.1
Sakamoto, S.2
Kagami, N.3
Wakuda, D.4
Kim, K.S.5
Nogi, M.6
-
10
-
-
33748585230
-
Low-temperature sintered nanoscale silver as a novel semiconductor device-metallized substrate interconnect material
-
[10] Bai, J.G., Zhang, Z.Z., Calata, J.N., Lu, G.Q., Low-temperature sintered nanoscale silver as a novel semiconductor device-metallized substrate interconnect material. IEEE Trans. Compon. Packag. Technol. 29 (2006), 589–593.
-
(2006)
IEEE Trans. Compon. Packag. Technol.
, vol.29
, pp. 589-593
-
-
Bai, J.G.1
Zhang, Z.Z.2
Calata, J.N.3
Lu, G.Q.4
-
11
-
-
34548175460
-
High-temperature operation of SiC power devices by low-temperature sintered silver die-attachment
-
[11] Bai, J.G., Yin, J., Zhang, Z., Lu, G.Q., van Wyk, J.D., High-temperature operation of SiC power devices by low-temperature sintered silver die-attachment. IEEE Trans. Adv. Packag. 30 (2007), 506–510.
-
(2007)
IEEE Trans. Adv. Packag.
, vol.30
, pp. 506-510
-
-
Bai, J.G.1
Yin, J.2
Zhang, Z.3
Lu, G.Q.4
van Wyk, J.D.5
-
12
-
-
79951931386
-
Reliability assessment of sintered nano-silver die attachment for power semiconductors
-
[12] Knoerr, M., Kraft, S., Schletz, A., Reliability assessment of sintered nano-silver die attachment for power semiconductors. Electronics Packaging Technology Conference (EPTC), 2010 12th, 2010, 56–61.
-
(2010)
Electronics Packaging Technology Conference (EPTC), 2010 12th
, pp. 56-61
-
-
Knoerr, M.1
Kraft, S.2
Schletz, A.3
-
13
-
-
84857609204
-
Low-pressure sintering of silver micro- and nanoparticles for a high temperature stable pick & place die attach
-
[13] Kahler, J., Heuck, N., Palm, G., Stranz, A., Waag, A., Peiner, E., Low-pressure sintering of silver micro- and nanoparticles for a high temperature stable pick & place die attach. Microelectronics and Packaging Conference (EMPC), 2011 18th European, 2011, 1–7.
-
(2011)
Microelectronics and Packaging Conference (EMPC), 2011 18th European
, pp. 1-7
-
-
Kahler, J.1
Heuck, N.2
Palm, G.3
Stranz, A.4
Waag, A.5
Peiner, E.6
-
14
-
-
84455208101
-
Mechanical properties of Nano-Ag as die attach materials
-
[14] Siow, K.S., Mechanical properties of Nano-Ag as die attach materials. J. Alloys Compd. 514 (2012), 6–14.
-
(2012)
J. Alloys Compd.
, vol.514
, pp. 6-14
-
-
Siow, K.S.1
-
15
-
-
84899089875
-
Are sintered silver joints ready for use as interconnect material in microelectronic packaging?
-
[15] Siow, K.S., Are sintered silver joints ready for use as interconnect material in microelectronic packaging?. J. Electron. Mater. 43 (2014), 947–961.
-
(2014)
J. Electron. Mater.
, vol.43
, pp. 947-961
-
-
Siow, K.S.1
-
16
-
-
84973660949
-
Identifying the development state of sintered silver (Ag) as a bonding material in the microelectronic packaging via a patent landscape study
-
020804–020804
-
[16] Siow, K.S., Lin, Y.T., Identifying the development state of sintered silver (Ag) as a bonding material in the microelectronic packaging via a patent landscape study. J. Electron. Packag., 138, 2016 020804–020804.
-
(2016)
J. Electron. Packag.
, vol.138
-
-
Siow, K.S.1
Lin, Y.T.2
-
18
-
-
84886884415
-
Study of die attach technologies for high temperature power electronics: silver sintering and gold–germanium alloy
-
[18] Sabbah, W., Azzopardi, S., Buttay, C., Meuret, R., Woirgard, E., Study of die attach technologies for high temperature power electronics: silver sintering and gold–germanium alloy. Microelectron. Reliab. 53 (2013), 1617–1621.
-
(2013)
Microelectron. Reliab.
, vol.53
, pp. 1617-1621
-
-
Sabbah, W.1
Azzopardi, S.2
Buttay, C.3
Meuret, R.4
Woirgard, E.5
-
19
-
-
79953755246
-
Low temperature sinter technology die attachment for power electronic applications
-
[19] Gobl, C., Faltenbacher, J., Low temperature sinter technology die attachment for power electronic applications. Integrated Power Electronics Systems (CIPS), 2010 6th International Conference, 2010, 1–5.
-
(2010)
Integrated Power Electronics Systems (CIPS), 2010 6th International Conference
, pp. 1-5
-
-
Gobl, C.1
Faltenbacher, J.2
-
21
-
-
85028228472
-
Pressureless sintering of microscale silver paste for 300 °C Applications, components, packaging and manufacturing technology
-
[21] Fang, Y., Johnson, R.W., Hamilton, M.C., Pressureless sintering of microscale silver paste for 300 °C Applications, components, packaging and manufacturing technology. IEEE Trans. 5 (2015), 1258–1264.
-
(2015)
IEEE Trans.
, vol.5
, pp. 1258-1264
-
-
Fang, Y.1
Johnson, R.W.2
Hamilton, M.C.3
-
22
-
-
84949678544
-
Study on high temperature bonding reliability of sintered nano-silver joint on bare copper plate
-
[22] Zhao, S.Y., Li, X., Mei, Y.H., Lu, G.Q., Study on high temperature bonding reliability of sintered nano-silver joint on bare copper plate. Microelectron. Reliab. 55 (2015), 2524–2531.
-
(2015)
Microelectron. Reliab.
, vol.55
, pp. 2524-2531
-
-
Zhao, S.Y.1
Li, X.2
Mei, Y.H.3
Lu, G.Q.4
-
23
-
-
84881107734
-
Sinter materials for broad process windows in DCB packages - concepts and results
-
[23] Schmitt, W., Fritzsche, S., Thomas, M., Sinter materials for broad process windows in DCB packages - concepts and results. Integrated Power Electronics Systems (CIPS), 2012 7th International Conference on, 2012, 1–6.
-
(2012)
Integrated Power Electronics Systems (CIPS), 2012 7th International Conference on
, pp. 1-6
-
-
Schmitt, W.1
Fritzsche, S.2
Thomas, M.3
-
24
-
-
84922220983
-
Microstructure evolution during 300°C storage of sintered Ag nanoparticles on Ag and Au substrates
-
[24] Paknejad, S.A., Dumas, G., West, G., Lewis, G., Mannan, S.H., Microstructure evolution during 300°C storage of sintered Ag nanoparticles on Ag and Au substrates. J. Alloys Compd. 617 (2014), 994–1001.
-
(2014)
J. Alloys Compd.
, vol.617
, pp. 994-1001
-
-
Paknejad, S.A.1
Dumas, G.2
West, G.3
Lewis, G.4
Mannan, S.H.5
-
25
-
-
85057263479
-
Effect of sintering atmosphere on the shear properties of pressureless sintered silver joint
-
[25] Chua, S.T., Siow, K.S., Jalar, A., Effect of sintering atmosphere on the shear properties of pressureless sintered silver joint. Electronic Manufacturing Technology Symposium (IEMT), 2012 36th IEEE/CPMT International, 2014, 1–6.
-
(2014)
Electronic Manufacturing Technology Symposium (IEMT), 2012 36th IEEE/CPMT International
, pp. 1-6
-
-
Chua, S.T.1
Siow, K.S.2
Jalar, A.3
-
26
-
-
84940795865
-
2) power chips at low temperatures for electronic packaging
-
[26] Fu, S., Mei, Y., Li, X., Ning, P., Lu, G.Q., Parametric study on pressureless sintering of nanosilver paste to bond large-area (≥100 mm2) power chips at low temperatures for electronic packaging. J. Electron. Mater. 44 (2015), 3973–3984.
-
(2015)
J. Electron. Mater.
, vol.44
, pp. 3973-3984
-
-
Fu, S.1
Mei, Y.2
Li, X.3
Ning, P.4
Lu, G.Q.5
-
27
-
-
10944229965
-
Microstructure and mechanical behavior of porous sintered steels
-
[27] Chawla, N., Deng, X., Microstructure and mechanical behavior of porous sintered steels. Mater. Sci. Eng. A 390 (2005), 98–112.
-
(2005)
Mater. Sci. Eng. A
, vol.390
, pp. 98-112
-
-
Chawla, N.1
Deng, X.2
-
28
-
-
84874988566
-
High Temperature Storage Life
-
JEDEC Solid State Technology Association 2010 South Arlington, VA
-
[28] JEDEC JESD22-A103E, High Temperature Storage Life. 2015, JEDEC Solid State Technology Association 2010, South Arlington, VA.
-
(2015)
-
-
JEDEC JESD22-A103E1
-
29
-
-
55149111616
-
Study of bonding technology using silver nanoparticles
-
[29] Morita, T., Ide, E., Yasuda, Y., Hirose, A., Kobayashi, K., Study of bonding technology using silver nanoparticles. Jpn. J. Appl. Phys. 47 (2008), 6615–6622.
-
(2008)
Jpn. J. Appl. Phys.
, vol.47
, pp. 6615-6622
-
-
Morita, T.1
Ide, E.2
Yasuda, Y.3
Hirose, A.4
Kobayashi, K.5
-
30
-
-
79951917319
-
Evolution of shear strength and microstructure of die bonding technologies for high temperature applications during thermal aging
-
[30] Egelkraut, S., Frey, L., Knoerr, M., Schletz, A., Evolution of shear strength and microstructure of die bonding technologies for high temperature applications during thermal aging. Electronics Packaging Technology Conference (EPTC), 2010 12th, 2010, 660–667.
-
(2010)
Electronics Packaging Technology Conference (EPTC), 2010 12th
, pp. 660-667
-
-
Egelkraut, S.1
Frey, L.2
Knoerr, M.3
Schletz, A.4
-
31
-
-
84867061560
-
Silver micropowders as SiC die attach material for high temperature applications
-
[31] Kisiel, R., Szczepanski, Z., Firek, P., Grochowski, J., Mysliwiec, M., Guziewicz, M., Silver micropowders as SiC die attach material for high temperature applications. Electronics Technology (ISSE), 2012 35th International Spring Seminar on, 2012, 144–148.
-
(2012)
Electronics Technology (ISSE), 2012 35th International Spring Seminar on
, pp. 144-148
-
-
Kisiel, R.1
Szczepanski, Z.2
Firek, P.3
Grochowski, J.4
Mysliwiec, M.5
Guziewicz, M.6
-
32
-
-
84878227705
-
Swelling phenomena in sintered die attach structures at high temperatures : reliability problems and solutions for an operation above 350°C
-
[32] Heuck, N., Mueller, S., Palm, G., Bakin, A., Waag, A., Swelling phenomena in sintered die attach structures at high temperatures : reliability problems and solutions for an operation above 350°C. iMAPS Proceedings of HiTEC 2010, 2010, 000018–000025.
-
(2010)
iMAPS Proceedings of HiTEC 2010
, pp. 000018-000025
-
-
Heuck, N.1
Mueller, S.2
Palm, G.3
Bakin, A.4
Waag, A.5
-
33
-
-
35748961993
-
Bonding of various metals using Ag metallo-organic nanoparticles-a novel bonding process using Ag metallo-organic nanoparticles
-
[33] Ide, E., Angata, S., Hirose, A., Kobayashi, K.F., Bonding of various metals using Ag metallo-organic nanoparticles-a novel bonding process using Ag metallo-organic nanoparticles. Mater. Sci. Forum 512 (2006), 383–388.
-
(2006)
Mater. Sci. Forum
, vol.512
, pp. 383-388
-
-
Ide, E.1
Angata, S.2
Hirose, A.3
Kobayashi, K.F.4
-
34
-
-
79151470332
-
Fast preparation of printable highly conductive polymer nanocomposites by thermal decomposition of silver carboxylate and sintering of silver nanoparticles
-
[34] Zhang, R., Lin, W., Moon, K.S., Wong, C.P., Fast preparation of printable highly conductive polymer nanocomposites by thermal decomposition of silver carboxylate and sintering of silver nanoparticles. ACS Appl. Mater. Interfaces 2 (2010), 2637–2645.
-
(2010)
ACS Appl. Mater. Interfaces
, vol.2
, pp. 2637-2645
-
-
Zhang, R.1
Lin, W.2
Moon, K.S.3
Wong, C.P.4
-
35
-
-
0024108461
-
Oxygen transport through high-purity, large-grain Ag
-
[35] Outlaw, R., Sankaran, S., Hoflund, G., Davidson, M., Oxygen transport through high-purity, large-grain Ag. J. Mater. Res. 3 (1988), 1378–1384.
-
(1988)
J. Mater. Res.
, vol.3
, pp. 1378-1384
-
-
Outlaw, R.1
Sankaran, S.2
Hoflund, G.3
Davidson, M.4
-
36
-
-
84997120303
-
Reliability improvement of high temperature sintered Ag die-attachment by adding sub-micron SiC particles
-
[36] Zhang, H., Nagao, S., Suganuma, K., Albrecht, H.J., Wilke, K., Reliability improvement of high temperature sintered Ag die-attachment by adding sub-micron SiC particles. PCIM Europe 2015; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2015, 1–8.
-
(2015)
PCIM Europe 2015; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
, pp. 1-8
-
-
Zhang, H.1
Nagao, S.2
Suganuma, K.3
Albrecht, H.J.4
Wilke, K.5
-
37
-
-
77954621175
-
Carboxylate-passivated silver nanoparticles and their application to sintered interconnection: a replacement for high temperature lead rich solders
-
[37] Ogura, H., Maruyama, M., Matsubayashi, R., Ogawa, T., Nakamura, S., Komatsu, T., Nagasawa, H., Ichimura, A., Isoda, S., Carboxylate-passivated silver nanoparticles and their application to sintered interconnection: a replacement for high temperature lead rich solders. J. Electron. Mater. 39 (2010), 1233–1240.
-
(2010)
J. Electron. Mater.
, vol.39
, pp. 1233-1240
-
-
Ogura, H.1
Maruyama, M.2
Matsubayashi, R.3
Ogawa, T.4
Nakamura, S.5
Komatsu, T.6
Nagasawa, H.7
Ichimura, A.8
Isoda, S.9
-
38
-
-
84879422596
-
Thermal fatigue of Ag flake sintering die-attachment for Si/SiC power devices
-
[38] Sakamoto, S., Nagao, S., Suganuma, K., Thermal fatigue of Ag flake sintering die-attachment for Si/SiC power devices. J. Mater. Sci. Mater. Electron. 24 (2013), 2593–2601.
-
(2013)
J. Mater. Sci. Mater. Electron.
, vol.24
, pp. 2593-2601
-
-
Sakamoto, S.1
Nagao, S.2
Suganuma, K.3
-
39
-
-
84876469577
-
Microstructural stability of Ag sinter joining in thermal cycling
-
[39] Sakamoto, S., Sugahara, T., Suganuma, K., Microstructural stability of Ag sinter joining in thermal cycling. J. Mater. Sci. Mater. Electron. 24 (2013), 1332–1340.
-
(2013)
J. Mater. Sci. Mater. Electron.
, vol.24
, pp. 1332-1340
-
-
Sakamoto, S.1
Sugahara, T.2
Suganuma, K.3
-
40
-
-
0005383340
-
In situ rapid thermal oxidation and reduction of copper thin films and their applications in ultralarge scale integration
-
[40] Hu, Y.Z., Sharangpani, R., Tay, S.P., In situ rapid thermal oxidation and reduction of copper thin films and their applications in ultralarge scale integration. J. Electrochem. Soc. 148 (2001), G669–G675.
-
(2001)
J. Electrochem. Soc.
, vol.148
, pp. G669-G675
-
-
Hu, Y.Z.1
Sharangpani, R.2
Tay, S.P.3
-
41
-
-
0016047690
-
Diffusion coefficient and electromigration velocity of copper in thin silver films
-
[41] DiGiacomo, G., Peressini, P., Rutledge, R., Diffusion coefficient and electromigration velocity of copper in thin silver films. J. Appl. Phys. 45 (1974), 1626–1629.
-
(1974)
J. Appl. Phys.
, vol.45
, pp. 1626-1629
-
-
DiGiacomo, G.1
Peressini, P.2
Rutledge, R.3
-
42
-
-
84915129691
-
Diffusion in copper and copper alloys, part II. copper-silver and copper-gold systems
-
[42] Butrymowicz, D.B., Manning, J.R., Read, M.E., Diffusion in copper and copper alloys, part II. copper-silver and copper-gold systems. J. Phys. Chem. Ref. Data 3 (1974), 527–602.
-
(1974)
J. Phys. Chem. Ref. Data
, vol.3
, pp. 527-602
-
-
Butrymowicz, D.B.1
Manning, J.R.2
Read, M.E.3
-
43
-
-
84893048436
-
Thermomechanical assessment of die-attach materials for wide bandgap semiconductor devices and harsh environment applications
-
[43] Navarro, L.A., Perpina, X., Godignon, P., Montserrat, J., Banu, V., Vellvehi, M., Jorda, X., Thermomechanical assessment of die-attach materials for wide bandgap semiconductor devices and harsh environment applications. IEEE Trans. Power Electron. 29 (2014), 2261–2271.
-
(2014)
IEEE Trans. Power Electron.
, vol.29
, pp. 2261-2271
-
-
Navarro, L.A.1
Perpina, X.2
Godignon, P.3
Montserrat, J.4
Banu, V.5
Vellvehi, M.6
Jorda, X.7
-
44
-
-
33646171716
-
Brief review of oxidation kinetics of copper at 350 °C to 1050 °C
-
[44] Mimura, K., Lim, J.W., Isshiki, M., Zhu, Y., Jiang, Q., Brief review of oxidation kinetics of copper at 350 °C to 1050 °C. Metall Mater. Trans. A 37 (2006), 1231–1237.
-
(2006)
Metall Mater. Trans. A
, vol.37
, pp. 1231-1237
-
-
Mimura, K.1
Lim, J.W.2
Isshiki, M.3
Zhu, Y.4
Jiang, Q.5
-
45
-
-
0016354849
-
Calculations of parabolic rate constants for metal oxidation
-
[45] Mrowec, S., Stokłosa, A., Calculations of parabolic rate constants for metal oxidation. Oxid. Metals 8 (1974), 379–391.
-
(1974)
Oxid. Metals
, vol.8
, pp. 379-391
-
-
Mrowec, S.1
Stokłosa, A.2
-
46
-
-
46749118749
-
Study on the effects of copper oxide growth on the peel strength of copper/polyimide
-
[46] Lee, H.J., Yu, J., Study on the effects of copper oxide growth on the peel strength of copper/polyimide. J. Electron. Mater. 37 (2008), 1102–1110.
-
(2008)
J. Electron. Mater.
, vol.37
, pp. 1102-1110
-
-
Lee, H.J.1
Yu, J.2
-
47
-
-
1542335495
-
Oxidation-rate excursions during the oxidation of copper in gaseous environments at moderate temperatures
-
[47] Feng, Z., Marks, C.R., Barkatt, A., Oxidation-rate excursions during the oxidation of copper in gaseous environments at moderate temperatures. Oxid. Metals 60 (2003), 393–408.
-
(2003)
Oxid. Metals
, vol.60
, pp. 393-408
-
-
Feng, Z.1
Marks, C.R.2
Barkatt, A.3
-
48
-
-
8344278007
-
A study of the initial oxidation of copper in 0.1 MPa oxygen and the effect of purity by metallographic methods
-
[48] Zhu, Y., Mimura, K., Isshiki, M., A study of the initial oxidation of copper in 0.1 MPa oxygen and the effect of purity by metallographic methods. Corros. Sci. 46 (2004), 2445–2454.
-
(2004)
Corros. Sci.
, vol.46
, pp. 2445-2454
-
-
Zhu, Y.1
Mimura, K.2
Isshiki, M.3
-
49
-
-
84881292301
-
Grain growth inhibition by connected porosity in sintered niobium
-
[49] Zilnyk, K.D., Leite, G.S., Sandim, H.R.Z., Rios, P.R., Grain growth inhibition by connected porosity in sintered niobium. Acta Mater. 61 (2013), 5821–5828.
-
(2013)
Acta Mater.
, vol.61
, pp. 5821-5828
-
-
Zilnyk, K.D.1
Leite, G.S.2
Sandim, H.R.Z.3
Rios, P.R.4
-
50
-
-
84975434826
-
Mechanical stresses during the oxidation of copper and their influence on oxidation kinetics. III
-
[50] Jaenicke, W., Leistikow, S., Stadler, A., Mechanical stresses during the oxidation of copper and their influence on oxidation kinetics. III. J. Electrochem. Soc. 111 (1964), 1031–1037.
-
(1964)
J. Electrochem. Soc.
, vol.111
, pp. 1031-1037
-
-
Jaenicke, W.1
Leistikow, S.2
Stadler, A.3
-
51
-
-
0014778133
-
Stresses during the gaseous oxidation of metals
-
[51] Appleby, W.K., Tylecote, R.F., Stresses during the gaseous oxidation of metals. Corros. Sci. 10 (1970), 325–341.
-
(1970)
Corros. Sci.
, vol.10
, pp. 325-341
-
-
Appleby, W.K.1
Tylecote, R.F.2
|