-
1
-
-
0018058027
-
Extreme temperature range microelectronics
-
Dec.
-
D. W. Palmer and R. Heckman, "Extreme temperature range microelectronics," IEEE Trans. Compon., Hybrids, Manuf. Technol., vol. 1, no. 4, pp. 333-340, Dec. 1978.
-
(1978)
IEEE Trans. Compon., Hybrids, Manuf. Technol.
, vol.1
, Issue.4
, pp. 333-340
-
-
Palmer, D.W.1
Heckman, R.2
-
2
-
-
85028210235
-
Design and assembly of high temperature distributed aeroengine control system demonstrator
-
S. T. Riches, C. Warn, K. Cannon, G. Rickard, L. Stoica, and C. Johnston, "Design and assembly of high temperature distributed aeroengine control system demonstrator," in Proc. Int. Conf. High Temperature Electron., Albuquerque, NM, USA, May 2014, pp. 285-290.
-
Proc. Int. Conf. High Temperature Electron., Albuquerque, NM, USA, May 2014
, pp. 285-290
-
-
Riches, S.T.1
Warn, C.2
Cannon, K.3
Rickard, G.4
Stoica, L.5
Johnston, C.6
-
3
-
-
34548171363
-
Low temperature joining technology - A high reliability alternative to solder contacts
-
U. Scheuermann and P. Wiedl, "Low temperature joining technology - A high reliability alternative to solder contacts," in Proc. Workshop Metal Ceram. Compos. Funct. Appl., Vienna, Austria, Jun. 1997, pp. 181-192.
-
Proc. Workshop Metal Ceram. Compos. Funct. Appl., Vienna, Austria, Jun. 1997
, pp. 181-192
-
-
Scheuermann, U.1
Wiedl, P.2
-
4
-
-
4244129617
-
Method of securing electronic components to a substrate
-
U.S. Patent, Mar. 7
-
H. Schwarzbauer, "Method of securing electronic components to a substrate," U.S. Patent 4 810 672, Mar. 7, 1989.
-
(1989)
-
-
Schwarzbauer, H.1
-
5
-
-
79953755246
-
Low temperature sinter technology die attachment for power electronic applications
-
C. Göbl and J. Faltenbacher, "Low temperature sinter technology die attachment for power electronic applications," in Proc. 6th Int. Conf. Integr. Power Electron. Syst., Nuremberg, Germany, Mar. 2010, pp. 1-5.
-
Proc. 6th Int. Conf. Integr. Power Electron. Syst., Nuremberg, Germany, Mar. 2010
, pp. 1-5
-
-
Göbl, C.1
Faltenbacher, J.2
-
6
-
-
33750841291
-
Thermomechanical reliability of low-temperature sintered silver die attached SiC power device assembly
-
Sep.
-
J. G. Bai and G.-Q. Lu, "Thermomechanical reliability of low-temperature sintered silver die attached SiC power device assembly," IEEE Trans. Device Mater. Rel., vol. 6, no. 3, pp. 436-441, Sep. 2006.
-
(2006)
IEEE Trans. Device Mater. Rel.
, vol.6
, Issue.3
, pp. 436-441
-
-
Bai, J.G.1
Lu, G.-Q.2
-
7
-
-
34548175460
-
High-temperature operation of SiC power devices by low-temperature sintered silver die-attachment
-
Aug.
-
J. Guofeng Bai, J. Yin, Z. Zhang, G.-Q. Lu, and J. D. van Wyk, "High-temperature operation of SiC power devices by low-temperature sintered silver die-attachment," IEEE Trans. Adv. Packag., vol. 30, no. 3, pp. 506-510, Aug. 2007.
-
(2007)
IEEE Trans. Adv. Packag.
, vol.30
, Issue.3
, pp. 506-510
-
-
Guofeng Bai, J.1
Yin, J.2
Zhang, Z.3
Lu, G.-Q.4
Van Wyk, J.D.5
-
8
-
-
35348849542
-
Processing and characterization of nanosilver pastes for die-attaching SiC devices
-
Oct.
-
J. G. Bai, J. N. Calata, and G.-Q. Lu, "Processing and characterization of nanosilver pastes for die-attaching SiC devices," IEEE Trans. Electron. Packag. Manuf., vol. 30, no. 4, pp. 241-245, Oct. 2007.
-
(2007)
IEEE Trans. Electron. Packag. Manuf.
, vol.30
, Issue.4
, pp. 241-245
-
-
Bai, J.G.1
Calata, J.N.2
Lu, G.-Q.3
-
9
-
-
77949570776
-
2) chips
-
Mar.
-
2) chips," IEEE Trans. Compon. Packag. Technol., vol. 33, no. 1, pp. 98-104, Mar. 2010.
-
(2010)
IEEE Trans. Compon. Packag. Technol.
, vol.33
, Issue.1
, pp. 98-104
-
-
Lei, T.G.1
Calata, J.N.2
Lu, G.-Q.3
Chen, X.4
Luo, S.5
-
10
-
-
84881474146
-
Simplification of the nanosilver sintering process for large-area semiconductor chip bonding: Reduction of hot-pressing temperature below 200°C
-
Aug.
-
K. Xiao, J. N. Calata, H. Zheng, K. D. T. Ngo, and G.-Q. Lu, "Simplification of the nanosilver sintering process for large-area semiconductor chip bonding: Reduction of hot-pressing temperature below 200°C," IEEE Trans. Compon., Packag., Manuf. Technol., vol. 3, no. 8, pp. 1271-1278, Aug. 2013.
-
(2013)
IEEE Trans. Compon., Packag., Manuf. Technol.
, vol.3
, Issue.8
, pp. 1271-1278
-
-
Xiao, K.1
Calata, J.N.2
Zheng, H.3
Ngo, K.D.T.4
Lu, G.-Q.5
-
11
-
-
84878867399
-
Low-temperature sintering of a nanosilver paste for attaching large-area power chips
-
K. Xiao, S. Luo, K. Ngo, and G.-Q. Lu, "Low-temperature sintering of a nanosilver paste for attaching large-area power chips," in Proc. IEEE Int. Symp. Adv. Packag. Mater. (APM), Feb./Mar. 2013, pp. 192-202.
-
Proc. IEEE Int. Symp. Adv. Packag. Mater. (APM), Feb./Mar. 2013
, pp. 192-202
-
-
Xiao, K.1
Luo, S.2
Ngo, K.3
Lu, G.-Q.4
-
12
-
-
84878632110
-
Low-pressure joining of large-area devices on copper using nanosilver paste
-
Jun.
-
H. Zheng, D. Berry, J. N. Calata, K. D. T. Ngo, S. Luo, and G.-Q. Lu, "Low-pressure joining of large-area devices on copper using nanosilver paste," IEEE Trans. Compon., Packag., Manuf. Technol., vol. 3, no. 6, pp. 915-922, Jun. 2013.
-
(2013)
IEEE Trans. Compon., Packag., Manuf. Technol.
, vol.3
, Issue.6
, pp. 915-922
-
-
Zheng, H.1
Berry, D.2
Calata, J.N.3
Ngo, K.D.T.4
Luo, S.5
Lu, G.-Q.6
-
13
-
-
84916233917
-
Pressureless, low temperature sintering of micro-scale silver paste for die attach for 300°C applications
-
F. Yu, R. W. Johnson, and M. Hamilton, "Pressureless, low temperature sintering of micro-scale silver paste for die attach for 300°C applications," in Proc. Int. High Temperature Electron. Conf., Albuquerque, NM, USA, May 2014, pp. 165-171.
-
Proc. Int. High Temperature Electron. Conf., Albuquerque, NM, USA, May 2014
, pp. 165-171
-
-
Yu, F.1
Johnson, R.W.2
Hamilton, M.3
-
14
-
-
84897764313
-
Evaluation of pressure free nanoparticle sintered silver die attach on silver and gold surfaces
-
G. Lewis, G. Dumas, and S. H. Mannan, "Evaluation of pressure free nanoparticle sintered silver die attach on silver and gold surfaces," in Proc. Int. Conf. Exhibit. High Temperature Electron. Netw., Jul. 2013, pp. 237-245.
-
Proc. Int. Conf. Exhibit. High Temperature Electron. Netw., Jul. 2013
, pp. 237-245
-
-
Lewis, G.1
Dumas, G.2
Mannan, S.H.3
-
16
-
-
84876705698
-
Assessing the reliability of die attach materials in electronic packages for high temperature applications
-
M. F. Sousa, S. Riches, C. Johnston, and P. S. Grant, "Assessing the reliability of die attach materials in electronic packages for high temperature applications," in Proc. Int. Conf. Exhibit. High Temperature Electron., May 2010, pp. 1-6.
-
Proc. Int. Conf. Exhibit. High Temperature Electron., May 2010
, pp. 1-6
-
-
Sousa, M.F.1
Riches, S.2
Johnston, C.3
Grant, P.S.4
-
17
-
-
84876908671
-
Migration of sintered nanosilver die-attach material on alumina substrate at high temperature
-
G.-Q. Lu, Y. Mei, X. C. D. Ibitayo, and S. Luo, "Migration of sintered nanosilver die-attach material on alumina substrate at high temperature," in Proc. Int. Conf. Exhibit. High Temperature Electron., May 2010, pp. 26-31.
-
Proc. Int. Conf. Exhibit. High Temperature Electron., May 2010
, pp. 26-31
-
-
Lu, G.-Q.1
Mei, Y.2
Ibitayo, X.C.D.3
Luo, S.4
|