메뉴 건너뛰기




Volumn , Issue , 2011, Pages

Low-pressure sintering of silver micro- and nanoparticles for a high temperature stable pick & place die attach

Author keywords

Electronics packaging; flip chip; nanoparticles; semiconductor device packaging; silver sintering

Indexed keywords

FLIP CHIP; HIGH TEMPERATURE; HYBRID CIRCUIT; LAYER THICKNESS; MICRO-PARTICLES; SEMICONDUCTOR DEVICE PACKAGING; SHEAR TESTS; SILVER PASTES; TEMPERATURE CYCLING; TEMPERATURE LOADS; YOUNG'S MODULUS;

EID: 84857609204     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (23)

References (19)
  • 1
    • 84878227705 scopus 로고    scopus 로고
    • Swelling Phenomena in Sintered Silver Die Attach Structures at High Temperatures: Reliability Problems and Solutions for an Operation above 350°C
    • Albuquerque, New Mexico, USA, May 11- 13
    • N. Heuck, et al., "Swelling Phenomena in Sintered Silver Die Attach Structures at High Temperatures: Reliability Problems and Solutions for an Operation above 350°C", Proceeding of International Conference on High Temperature Electronics (HiTEC), Albuquerque, New Mexico, USA, May 11-13, 2010.
    • (2010) Proceeding of International Conference on High Temperature Electronics (HiTEC)
    • Heuck, N.1
  • 2
    • 0025800802 scopus 로고
    • Novel large area joining technique for improved power device performance
    • H. Schwarzbauer, et al., "Novel Large Area Joining Technique for Improved Power Device Performance", Transactions on Industry Applications, Vol. 21, No. I, pp. 93-95, 199J.
    • (1991) Transactions on Industry Applications , vol.21 , Issue.1 , pp. 93-95
    • Schwarzbauer, H.1
  • 4
    • 33947680413 scopus 로고    scopus 로고
    • Die niedertemperatur-verbindungstechnik der leistungselektronik
    • Thesis, Braunschweig
    • C. Mertens, "Die Niedertemperatur-Verbindungstechnik der Leistungselektronik", PHD-Thesis, Braunschweig, 2004.
    • (2004) PHD
    • C. Mertens1
  • 7
    • 79951931386 scopus 로고    scopus 로고
    • Reliability assessment of sintered nano-silver die attachment for power semiconductors
    • Singapore, December 8-10
    • M. Knoerr, et al., "Reliability Assessment of Sintered Nano-Silver Die Attachment for Power Semiconductors", Proceedings of the 2010 Electronics Packaging Technology Conference (EPTC), Singapore, December 8-10, pp. 56-61, 2010.
    • (2010) Proceedings of the 2010 Electronics Packaging Technology Conference (EPTC) , pp. 56-61
    • Knoerr, M.1
  • 8
    • 34548175460 scopus 로고    scopus 로고
    • High Temperature Operation of SiC Power Devices by Low-Temperature Sintered Silver DieAttachment
    • J. G. Bai, J. Yin, Z. Zhang, G.-Q. Lu, "High Temperature Operation of SiC Power Devices by Low-Temperature Sintered Silver DieAttachment", Transactions on Advanced Packaging, Vol. 30, pp. 506-510, 2007.
    • (2007) Transactions on Advanced Packaging , vol.30 , pp. 506-510
    • Bai, J.G.1    Yin, J.2    Zhang, Z.3    Lu, G.-Q.4
  • 9
    • 77949570776 scopus 로고    scopus 로고
    • Low-temperature sintering of nanoscale silver paste for attaching largearea (> 100 mm2) chips
    • T. G. Lei, et al., "Low-Temperature Sintering of Nanoscale Silver Paste for Attaching LargeArea (> 100 mm2) Chips", Transactions on Components and Packaging Technologies, Vol. 33, No. 1, pp. 98-104, 2010.
    • (2010) Transactions on Components and Packaging Technologies , vol.33 , Issue.1 , pp. 98-104
    • Lei, T.G.1
  • 10
    • 70349243074 scopus 로고    scopus 로고
    • Room-temperature sintering process of ag nanoparticle paste
    • D. Wakuda, et al., "Room-Temperature Sintering Process of Ag Nanoparticle Paste", Transactions on Components and Packaging Technologies, Vol. 32, No. 3, pp. 627-632, 2009.
    • (2009) Transactions on Components and Packaging Technologies , vol.32 , Issue.3 , pp. 627-632
    • Wakuda, D.1
  • 11
    • 78651327600 scopus 로고    scopus 로고
    • Die-attach for hightemperature applications using fineplacerpressure- sintering (FPS)
    • Berlin, Germany, September 13-16
    • J. Kahler et al., "Die-Attach for HighTemperature applications using FineplacerPressure-Sintering (FPS)", Proceedings of Electronics System Integration Technology Conferences (ESTC), Berlin, Germany, September 13-16, 2010.
    • (2010) Proceedings of Electronics System Integration Technology Conferences (ESTC)
    • Kahler, J.1
  • 12
    • 0347992371 scopus 로고
    • On the relationship between the properties and the microstructure of multiphase materials. part III: Microstructure and young's modulus of elasticity
    • G. Ondracek, "On the Relationship Between the Properties and the Microstructure of Multiphase Materials. Part 111: Microstructure and Young's Modulus of Elasticity", Z. Werkstofft., Vol. 9, pp. 31-36, 1979.
    • (1979) Z. Werkstofft. , vol.9 , pp. 31-36
    • Ondracek, G.1
  • 13
    • 84981435589 scopus 로고
    • On the relationship between the properties and the microstructure of multiphase materials. part III: Microstructure and young's modulus of elasticity
    • G. Ondracek, "On the Relationship Between the Properties and the Microstructure of Multiphase Materials. Part 111: Microstructure and Young's Modulus of Elasticity", Z. Werkstofft., Vol. 9, pp. 96-100, 1979.
    • (1979) Z. Werkstofft. , vol.9 , pp. 96-100
    • Ondracek, G.1
  • 14
    • 84857549310 scopus 로고    scopus 로고
    • Chip-substrat-kontaktierung optoelektronischer bauelemente mittels fineplacer-verbindungstechnik
    • Erfurt, Germany, March 3- 4
    • J. Kahler et al., "Chip-Substrat-Kontaktierung optoelektronischer Bauelemente mittels Fineplacer-Verbindungstechnik", Proceedings of Micro-Nano-Integration (MNI), Erfurt, Germany, March 3-4, 2010.
    • (2010) Proceedings of Micro-Nano-Integration (MNI)
    • Kahler, J.1
  • 15
    • 0026999330 scopus 로고
    • Plastic Yield Behaviour of Porous Metals
    • D. N. Lee,, et al., "Plastic Yield Behaviour of Porous Metals", Powder Metallurgy, Vol. 35, No. 4, pp. 275-279, 1992.
    • (1992) Powder Metallurgy , vol.35 , Issue.4 , pp. 275-279
    • Lee, D.N.1
  • 16
    • 51449102625 scopus 로고    scopus 로고
    • Interfacial Adhesion of NanoParticle Silver Interconnects for Electronics Packaging Application
    • S. Joo, et al., "Interfacial Adhesion of NanoParticle Silver Interconnects for Electronics Packaging Application", IEEE Electronic Components and Technology Conference, pp. 1417-1423, 2008.
    • (2008) IEEE Electronic Components and Technology Conference , pp. 1417-1423
    • Joo, S.1
  • 17
    • 84857594830 scopus 로고    scopus 로고
    • Modeme beschichtungsverfahren
    • Weinheim, Chapter 2
    • F. W. Bach, et al., "Modeme Beschichtungsverfahren", A Wiley-Interscience Publication, Weinheim, Chapter 2, pp. 15-21, 2005.
    • (2005) A Wiley-Interscience Publication , pp. 15-21
    • Bach, F.W.1
  • 18
    • 84857537323 scopus 로고    scopus 로고
    • Semiconductor material and device characterization
    • third edition, New Jersey, Chapter 1
    • D. K. Schroeder, "Semiconductor material and device characterization", A Wiley-Interscience Publication, third edition, New Jersey, Chapter 1, pp. 1-60, 2006.
    • (2006) A Wiley-Interscience Publication , pp. 1-60
    • Schroeder, D.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.