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Volumn , Issue , 2011, Pages 60-62

A new generation of power modules with sinter-technology for the automotive industry

Author keywords

[No Author keywords available]

Indexed keywords

BOND WIRE; CERAMIC SUBSTRATES; ELECTRONIC INDUSTRIES; FLEXIBLE CIRCUIT BOARDS; FURTHER DEVELOPMENT; PIN FIN HEAT SINKS; POWER CHIPS; POWER MODULE; RELIABILITY PERFORMANCE; SINTER PROCESS; WEAK POINTS;

EID: 83355163511     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDPC.2011.6085549     Document Type: Conference Paper
Times cited : (7)

References (6)
  • 1
    • 77956576750 scopus 로고    scopus 로고
    • Failure mechanism and improvement potential of IGBTaposs short circuit operation
    • Hiroshima
    • F. Hille, F. Umbach, T. Raker: "Failure mechanism and improvement potential of IGBTaposs short circuit operation"Proc. ISPSD 2010, pp. 33, Hiroshima, 2010
    • (2010) Proc. ISPSD 2010 , pp. 33
    • Hille, F.1    Umbach, F.2    Raker, T.3
  • 2
    • 79953755246 scopus 로고    scopus 로고
    • Low Temperature Sinter Technology Die Attachment for Power Electronic Applications
    • Nuremberg
    • C. Göbl: "Low Temperature Sinter Technology Die Attachment for Power Electronic Applications"Proc. CIPS 2010, pp. 327, Nuremberg, 2010
    • (2010) Proc. CIPS 2010 , pp. 327
    • Göbl, C.1
  • 3
    • 83355174717 scopus 로고    scopus 로고
    • German Patent: DE 10 2007 006 706
    • German Patent: DE 10 2007 006 706
  • 5
    • 80052919019 scopus 로고    scopus 로고
    • Power cycling results for different control strategies
    • U.Scheuermann, S.Schuler: Power cycling results for different control strategies, Microelectronics Reliability 50 (2010), 1203-1209.
    • (2010) Microelectronics Reliability , vol.50 , pp. 1203-1209
    • Scheuermann, U.1    Schuler, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.