-
1
-
-
0027576098
-
6-H silicon carbide devices and applications
-
J. W. Palmour, J. A. Edmond, H. S. Kong, and C. H. Carter, "6-H silicon carbide devices and applications," Physica B, vol. 185, pp. 461-465, 1993.
-
(1993)
Physica B
, vol.185
, pp. 461-465
-
-
Palmour, J.W.1
Edmond, J.A.2
Kong, H.S.3
Carter, C.H.4
-
2
-
-
34548166710
-
600 V, 1-40 A, Schottky diodes in SiC and their applications
-
Online, Available
-
A. Agarwal, R. Singh, S. Ryu, J. Richmond, C. Capell, S. Schwab, B. Moore, and J. Palmour, "600 V, 1-40 A, Schottky diodes in SiC and their applications," CREE Power Appl. Notes, 2005 [Online]. Available: www.cree.com/ftp/pub/CPWR-AN02.pdf
-
(2005)
CREE Power Appl. Notes
-
-
Agarwal, A.1
Singh, R.2
Ryu, S.3
Richmond, J.4
Capell, C.5
Schwab, S.6
Moore, B.7
Palmour, J.8
-
3
-
-
0035305734
-
SiC devices for advanced power and high-temperature applications
-
Apr
-
W. Wondrak, R. Held, E. Niemann, and U. Schmid, "SiC devices for advanced power and high-temperature applications," IEEE Trans. Ind. Electron., vol. 48, no. 2, pp. 307-308, Apr. 2001.
-
(2001)
IEEE Trans. Ind. Electron
, vol.48
, Issue.2
, pp. 307-308
-
-
Wondrak, W.1
Held, R.2
Niemann, E.3
Schmid, U.4
-
4
-
-
0033306992
-
High temperature (450°C) reliable NMISFET's on p-type 6H-SiC
-
X. W. Wang, W. J. Zhu, X. Guo, T. P. Ma, J. B. Tucker, and M. V. Rao, "High temperature (450°C) reliable NMISFET's on p-type 6H-SiC," in IEEE Tech. Dig. Int. Electron Devices Meeting, 1999, pp. 209-212.
-
(1999)
IEEE Tech. Dig. Int. Electron Devices Meeting
, pp. 209-212
-
-
Wang, X.W.1
Zhu, W.J.2
Guo, X.3
Ma, T.P.4
Tucker, J.B.5
Rao, M.V.6
-
5
-
-
0037532594
-
High temperature SiC trench gate p-IGBTs
-
Mar
-
R. Singh, S. H. Ryu, D. C. Capell, and J. W. Palmour, "High temperature SiC trench gate p-IGBTs," IEEE Trans. Electron Devices, vol. 50, no. 3, pp. 774-784, Mar. 2003.
-
(2003)
IEEE Trans. Electron Devices
, vol.50
, Issue.3
, pp. 774-784
-
-
Singh, R.1
Ryu, S.H.2
Capell, D.C.3
Palmour, J.W.4
-
6
-
-
11244292142
-
Silicon-carbide (SiC) semiconductor power electronics for extreme high-temperature environments
-
Mar
-
J. Homberger, A. B. Lostetter, K. J. Olejniczak, T. McNutt, S. M. Lal, and A. Mantooth, "Silicon-carbide (SiC) semiconductor power electronics for extreme high-temperature environments," in Proc. IEEE Aerospace Conf., Mar. 2004, vol. 4, pp. 2538-2555.
-
(2004)
Proc. IEEE Aerospace Conf
, vol.4
, pp. 2538-2555
-
-
Homberger, J.1
Lostetter, A.B.2
Olejniczak, K.J.3
McNutt, T.4
Lal, S.M.5
Mantooth, A.6
-
7
-
-
0036768050
-
Silver-indium joints produced at low temperature for high temperature devices
-
Sep
-
R. W. Chuang and C. C. Lee, "Silver-indium joints produced at low temperature for high temperature devices," IEEE Trans. Compon. Packag. Technol., vol. 25, no. 3, pp. 453-458, Sep. 2002.
-
(2002)
IEEE Trans. Compon. Packag. Technol
, vol.25
, Issue.3
, pp. 453-458
-
-
Chuang, R.W.1
Lee, C.C.2
-
8
-
-
0034428510
-
-
L. Y. Chen, G. W. Hunter, and P. G. Neudeck, Silicon carbide die-attach scheme for 500°C operation, in Proc. Materials Res. Soc. Symp. Proc. Wide-Bandgap Electronic Devices Symp., San Francisco, CA, 2001, 622, pp. T8.10.1-T8.10.6.
-
L. Y. Chen, G. W. Hunter, and P. G. Neudeck, "Silicon carbide die-attach scheme for 500°C operation," in Proc. Materials Res. Soc. Symp. Proc. Wide-Bandgap Electronic Devices Symp., San Francisco, CA, 2001, vol. 622, pp. T8.10.1-T8.10.6.
-
-
-
-
9
-
-
3042762894
-
Thermomechanical analysis of gold-based SiC die-attach assembly
-
Dec
-
K. Meyyappan, P. McCluskey, and L. Y. Chen, "Thermomechanical analysis of gold-based SiC die-attach assembly," IEEE Trans. Device Mater. Rel., vol. 3, no. 4, pp. 152-158, Dec. 2003.
-
(2003)
IEEE Trans. Device Mater. Rel
, vol.3
, Issue.4
, pp. 152-158
-
-
Meyyappan, K.1
McCluskey, P.2
Chen, L.Y.3
-
10
-
-
0025800802
-
Novel large area joining technique for improved power device performance
-
Jan./Feb
-
H. Schwarzbauer, "Novel large area joining technique for improved power device performance," IEEE Trans. Ind. Appl., vol. 27, no. 1, pp. 93-95, Jan./Feb. 1991.
-
(1991)
IEEE Trans. Ind. Appl
, vol.27
, Issue.1
, pp. 93-95
-
-
Schwarzbauer, H.1
-
11
-
-
0028697084
-
Reduction of thermo-mechanical stress by applying a low temperature joining technique
-
S. Klaka and R. Sittig, "Reduction of thermo-mechanical stress by applying a low temperature joining technique," in Proc. 6th Int. Symp. Power Semiconductor Devices ICs, 1994, vol. 3, pp. 259-264.
-
(1994)
Proc. 6th Int. Symp. Power Semiconductor Devices ICs
, vol.3
, pp. 259-264
-
-
Klaka, S.1
Sittig, R.2
-
12
-
-
34548171363
-
Low temperature joining technology-A high reliability alternative to solder contacts
-
Vienna, Austria, Jun
-
U. Scheuermann and P. Wiedl, "Low temperature joining technology-A high reliability alternative to solder contacts," in Workshop Metal Ceramic Composites Functional Appl., Vienna, Austria, Jun. 1997, pp. 181-1920.
-
(1997)
Workshop Metal Ceramic Composites Functional Appl
, pp. 181-1920
-
-
Scheuermann, U.1
Wiedl, P.2
-
13
-
-
14644401074
-
Thermal behavior of silver nanoparticles for low-temperature interconnect applications
-
K. S. Moon, H. Dong, R. Maric, S. Pothukuchi, A. Hunt, Y. Li, and C. P. Wong, "Thermal behavior of silver nanoparticles for low-temperature interconnect applications," J. Electronic Mater., vol. 34, no. 2, pp. 168-175, 2005.
-
(2005)
J. Electronic Mater
, vol.34
, Issue.2
, pp. 168-175
-
-
Moon, K.S.1
Dong, H.2
Maric, R.3
Pothukuchi, S.4
Hunt, A.5
Li, Y.6
Wong, C.P.7
-
14
-
-
33748585230
-
Low-temperature sintered nanoscale silver as a novel semiconductor device-metallized substrate interconnect material
-
Sep
-
J. G. Bai, Z. Z. Zhang, J. N. Calata, and G. Q. Lu, "Low-temperature sintered nanoscale silver as a novel semiconductor device-metallized substrate interconnect material," IEEE Trans. Compon. Packing. Technol., vol. 29, no. 3, pp. 589-593, Sep. 2006.
-
(2006)
IEEE Trans. Compon. Packing. Technol
, vol.29
, Issue.3
, pp. 589-593
-
-
Bai, J.G.1
Zhang, Z.Z.2
Calata, J.N.3
Lu, G.Q.4
-
15
-
-
33845585645
-
Low-temperature sintering of nanoscale silver paste for semi-conductor device interconnection,
-
Ph.D. dissertation, Virginia Tech, Blacksburg, VA, Oct
-
G. Bai, "Low-temperature sintering of nanoscale silver paste for semi-conductor device interconnection," Ph.D. dissertation, Virginia Tech, Blacksburg, VA, Oct. 2005.
-
(2005)
-
-
Bai, G.1
-
16
-
-
34548185851
-
-
CREE datasheet CPWR-0600S010 Silicon Carbide Schottky Diodes CREE Inc
-
CREE datasheet CPWR-0600S010 Silicon Carbide Schottky Diodes CREE Inc.,, Durham, CA, 2002,.
-
(2002)
-
-
Durham, C.A.1
-
17
-
-
33750841291
-
Thermomechanical reliability of low-temperature sintered silver die-attached SiC power device assembly
-
Sep
-
J. G. Bai and G. Q. Lu, "Thermomechanical reliability of low-temperature sintered silver die-attached SiC power device assembly," IEEE Trans. Device Mater. Rel., vol. 6, no. 3, pp. 436-441, Sep. 2006.
-
(2006)
IEEE Trans. Device Mater. Rel
, vol.6
, Issue.3
, pp. 436-441
-
-
Bai, J.G.1
Lu, G.Q.2
-
18
-
-
21444434529
-
Measurement of the electrical mobility of silver over hot tin oxide surface
-
W. M. Sears and D. A. Love, "Measurement of the electrical mobility of silver over hot tin oxide surface," Phys. Rev. B, vol. 47, no. 19, pp. 12972-12975, 1993.
-
(1993)
Phys. Rev. B
, vol.47
, Issue.19
, pp. 12972-12975
-
-
Sears, W.M.1
Love, D.A.2
-
19
-
-
0036506018
-
High-temperature storage and thermal cycling studies of thick film and wirewound resistors
-
Mar
-
J. E. Naefe, R. W. Johnson, and R. R. Grzybowski, "High-temperature storage and thermal cycling studies of thick film and wirewound resistors," IEEE Trans. Compon. Packag. Technol., vol. 25, no. 1, pp. 45-52, Mar. 2002.
-
(2002)
IEEE Trans. Compon. Packag. Technol
, vol.25
, Issue.1
, pp. 45-52
-
-
Naefe, J.E.1
Johnson, R.W.2
Grzybowski, R.R.3
-
20
-
-
34548188438
-
Online]. Available
-
International Rectifier Inc
-
International Rectifier Inc., El Segundo, CA, Reports on Direct FET TM. [Online]. Available: http://www.irf.com
-
Reports on Direct FET TM
-
-
El Segundo, C.A.1
-
21
-
-
33750334783
-
Discussion on the reliability issues of solder-bump and direct-solder bonded power device packages having double-sided cooling capability
-
J. G. Bai, J. N. Calata, and G. Q. Lu, "Discussion on the reliability issues of solder-bump and direct-solder bonded power device packages having double-sided cooling capability," J. Electron. Packag., vol. 128, no. 3, pp. 208-214, 2006.
-
(2006)
J. Electron. Packag
, vol.128
, Issue.3
, pp. 208-214
-
-
Bai, J.G.1
Calata, J.N.2
Lu, G.Q.3
|