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Volumn , Issue , 2011, Pages 10-15

SiC power devices - Present status, applications and future perspective

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL ELECTRIC FIELD; CRITICAL FIELD STRENGTH; FUTURE PERSPECTIVES; HIGH POWER APPLICATIONS; REAL APPLICATIONS; SILICON CARBIDES (SIC); SILICON-BASED DEVICES; WIDE-BAND-GAP SEMICONDUCTOR;

EID: 84880731411     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.2011.5890778     Document Type: Conference Paper
Times cited : (207)

References (31)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.