AFM image artifacts

Applied Surface Science

Volumn 304, Issue , 2014, Pages 11-19

  Golek F ^a   Mazur, P ^a   Ryszka, Z ^a   Zuber, S ^a  

^a UNIVERSITY OF WROC AW   (Poland)

Author keywords

AFM; Artifacts

Indexed keywords

SURFACE PHENOMENA; SURFACES;

AFM IMAGE; ARTIFACTS; IMAGE ARTIFACTS; INSTRUMENT OPERATION; SURFACE SCIENCE;

ATOMIC FORCE MICROSCOPY;

EID: 84899925561     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2014.01.149     Document Type: Conference Paper

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