Tip artifacts in atomic force microscope imaging of ion bombarded nanostructures on germanium surfaces

Journal of Applied Physics

Volumn 82, Issue 11, 1997, Pages 5859-5861

  Chen, Y J ^a   Wilson, I H ^a   Lee, C S ^a   Xu, J B ^a   Yu, M L ^b  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347142111     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366454     Document Type: Article

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