Blind reconstruction of scanning probe image data

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1557-1562

  Williams, P M ^a   Shakesheff, K M ^a   Davies, M C ^a   Jackson, D E ^a   Roberts, C J ^a   Tendier, S J B ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000599961     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589138     Document Type: Article

References (18)

1. G. Binnig and H. Rohrer, Helv. Phys. Acta 55, 726 (1982).
2. J. Villarrubia, Surf. Sci. 321, 287 (1994).
3. R. Chicon, M. Ortuno, and J. Abellan, Surf. Sci. 181, 107 (1987).
4. Ph. Niedermann and O. Fischer, J. Microsc. 152, 93 (1988).
5. G. Reiss, J. Vancea, H. Wittmann, J. Zweck, and H. Hoffmann, J. Appl. Phys. 67, 1156 (1990).
6. D. Keller, Surf. Sci. 253, 353 (1991).
7. G. Reiss, H. Brückl, J. Vancea, R. Lecheleer, and E. Hastreiter, J. Appl. Phys. 70, 523 (1991).
8. D. J. Keller and F. S. Franke, Surf. Sci. 294, 409 (1993).
9. P. Markiewicz and M. C. Goh, Langmuir 10, 5 (1994).
10. J. Vesenka, S. Manne, R. Giberson, T. Marsh, and E. Henderson, Biophys. J. 65, 992 (1993).
11. D. L. Wilson, K. S. Kump, S. J. Eppel, and R. E. Marchant, Langmuir 11, 265 (1995).
12. S. Xu and M. F. Arnsdorf, J. Microsc. 173, 199 (1994).
13. P. M. Williams, K. M. Shakesheff, M. C. Davies, D. E. Jackson, C. J. Roberts, and S. J. B. Tendler (unpublished).
14. E. J. van Loenen, D. Dijkkamp, A. J. Hoeven, J. M. Lenssinck, and J. Dieleman. Appl. Phys. Lett. 56, 1755 (1990).
15. L. Montelius and J. O. Tegenfeldt, Appl. Phys. Lett. 62, 2628 (1993).
16. T. O. Glasbey, G. N. Batts, M. C. Davies, D. E. Jackson, C. V. Nicholas, M. D. Purbrick, C. J. Roberts, and P. M. Williams, Surf. Sci. Lett. 318, L1219 (1994).
17. K. M. Shakesheff, M. C. Davies, D. E. Jackson, G. J. Leggett, C. J. Roberts, S. J. B. Tender, and P. M. Williams, Nanobiology 3, 41 (1994).
18. G. S. Pingali and R. Jain, in Proceedings of the IEEE Workshop Applied Computer Vision 1992, p. 282.