AFM imaging artifacts due to bacterial cell height and AFM tip geometry

Langmuir

Volumn 19, Issue 3, 2003, Pages 851-857

  Velegol, Stephanie B ^a,b   Pardi, Shaun ^a   Li, Xu ^a   Velegol, Darrell ^a   Logan, Bruce E ^a  

^a The Pennsylvania State University   (United States)

^b BUCKNELL UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; BACTERIA; CELLS; DEHYDRATION; ESCHERICHIA COLI; IMAGING TECHNIQUES; MATHEMATICAL MODELS; MORPHOLOGY; POLYSTYRENES; SURFACE STRUCTURE;

BACTERIAL CELL HEIGHT; BUCKHOLDERIA CEPACIA; IMAGING ARTIFACTS; IMAGING BACTERIA; INTERACTION FORCES; PSEUDOMONAS CHRYSOSPORIUM; PSEUDOMONAS STUTZERI; SHEWANELLA PUTREFACIENS; STAPHYLOCOCCUS AUREUS;

ATOMIC FORCE MICROSCOPY;

EID: 0037417910     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la026440g     Document Type: Article

References (21)

1. Schoenenberger, C.-A.; Hoh, J. H. Biophys. J. 1994, 67, 929-936.
2. Putnam, C. A. J.; van der Werf, K. O.; de Grooth, B. G.; van Hulst, N. F.; Greve, J. Biophys. J. 1994, 67, 1749-1753.
3. Camesano, T. A.; Natan, M. J.; Logan, B. E. Langmuir 2000, 16, 4563-4572.
4. Sokolov, I.; Smith, D. S.; Henderson, G. S.; Gorby, Y. A.; Ferris, F. G. Environ. Sci. Technol. 2001, 35, 341-347.
5. Tollersund, T.; Berge, T.; Andersen, S. R.; Lund, A. APMIS 2001, 109, 541-545.
6. Ong, Y.-L.; Razatos, A.; Georgiou, G.; Sharma, M. M. Langmuir 1999, 15, 2719-2725.
7. Velegol, S. B.; Logan, B. E. Langmuir 2002, 18, 5256-5262.
8. Hoh, J. H.; Schoenenberger, C.-A. J. Cell Sci. 1994, 107, 1105-1114.
9. A-Hassan, E.; Hienz, W. F.; Antonik, M. D.; D'Costa, N. P.; Nageswaran, S.; Schoenenberger, C.-A.; Hoh, J. H. Biophys. J. 1998, 74, 1564-1578.
10. Braet, F.; Rotsch, C.; Wisse, E.; Radmacher, M. Appl. Phys. A: Mater. Sci. Process. 1998, 66, S575-S578.
11. Camesano, T. A.; Logan, B. E. Environ. Sci. Technol. 2000, 34, 3354-3362.
12. Pardi, S.; Logan, B. E. In preparation.
13. Boonaert, C. J. P.; Rouxhet, P. G.; Dufrene, Y. F. Surf. Interface Anal. 2000, 30, 32-35.
14. Blackford, B. L.; Jericho, M. H.; Mulhern, P. J. Scanning Microsc. 1991, 5, 907-918.
15. Allen, M. J.; Hud, N. V.; Balooch, M.; Tench, R. J.; Siekhaus, W. J.; Balhourn, R. Ultramicroscopy 1992, 42-44.
16. Aumond, B. D.; Youcef-Toumi, K. In Metrology, Inspection and Process Control for Microlithography XV; The International Society for Optical Engineering: Santa Clara, CA, 2001: Vol. 4344, pp. 46-57.
17. Maurice, P. A. Colloids Surf., A 1996, 107, 57-75.
18. Griffith, J. E.; Grigg, D. A. J. Appl. Phys. 1993, 74, R83-R107.
19. Hopwood, D. Histochem. J. 1972, 4, 267-303.
20. Amro, N. A.; Kotra, L. P.; Wadu-Mesthrige, K.; Bulychev, A.; Mobashery, S.; Liu. G.-y. Langmuir 2000, 16, 2789-2796.
21. Bolshakova, A. V.; Kiselyova, O. I.; Filonov, A. S.; Frolova, O. Y.; Lyubchenko, Y. L.; Yaminsky, I. V. Ultramicroscopy 2001, 86, 121-128.