Eliminating mechanical perturbations in scanning probe microscopy

Nanotechnology

Volumn 13, Issue 5, 2002, Pages 663-665

  Schitter, G ^a   Stemmer, A ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDWIDTH; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; VIBRATIONS (MECHANICAL);

MECHANICAL PERTURBATIONS; SCANNING PROBE MICROSCOPY;

MICROSCOPES;

EID: 0036801292     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/13/5/324     Document Type: Article

References (7)

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