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Volumn 150, Issue 3-4, 2008, Pages 561-566

Development of a low temperature scanning probe microscope

Author keywords

Low temperature instrumentation and new techniques

Indexed keywords

FREQUENCY-MODULATION ATOMIC FORCE MICROSCOPY; TOPOGRAPHIC IMAGING;

EID: 38549119548     PISSN: 00222291     EISSN: 15737357     Source Type: Journal    
DOI: 10.1007/s10909-007-9584-6     Document Type: Conference Paper
Times cited : (7)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.