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Volumn 150, Issue 3-4, 2008, Pages 561-566
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Development of a low temperature scanning probe microscope
a
KEIO UNIVERSITY
(Japan)
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Author keywords
Low temperature instrumentation and new techniques
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Indexed keywords
FREQUENCY-MODULATION ATOMIC FORCE MICROSCOPY;
TOPOGRAPHIC IMAGING;
CRYOGENIC EQUIPMENT;
DIFFRACTION GRATINGS;
FREQUENCY MODULATION;
QUARTZ;
TOPOGRAPHY;
SCANNING PROBE MICROSCOPY;
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EID: 38549119548
PISSN: 00222291
EISSN: 15737357
Source Type: Journal
DOI: 10.1007/s10909-007-9584-6 Document Type: Conference Paper |
Times cited : (7)
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References (12)
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