Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

Review of Scientific Instruments

Volumn 75, Issue 3, 2004, Pages 689-693

  Kassies, Roel ^a   Van Der Werf, Kees O ^a   Bennink, Martin L ^b   Otto, Cees ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; FEEDBACK; FOURIER TRANSFORMS; LASER APPLICATIONS; LIGHT INTERFERENCE; LIGHT MODULATION; LIGHT REFLECTION; LIGHT SCATTERING; PHOTODIODES; SHOT NOISE; SIGNAL TO NOISE RATIO; SILICON NITRIDE;

LASER CURRENT MODULATION; OPTICAL FEEDBACK;

ATOMIC FORCE MICROSCOPY;

EID: 1842479743     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1646767     Document Type: Article

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