Atom manipulation and image artifact on Si(1 1 1)7 × 7 surface using a low temperature noncontact atomic force microscope

Applied Surface Science

Volumn 188, Issue 3-4, 2002, Pages 285-291

  Sugawara, Y ^a   Sano, Y ^a   Suehira, N ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Atom manipulation; Atomic force microscope (AFM); Field evaporation; Low temperature; Si(1 0 0); Si(1 1 1)

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIMERS; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; EVAPORATION; IMAGE ANALYSIS; LOW TEMPERATURE EFFECTS; SEMICONDUCTING SILICON;

ATOM MANIPULATIONS; IMAGE ARTIFACTS;

SURFACE TOPOGRAPHY;

EID: 0037187213     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00940-0     Document Type: Conference Paper

References (16)