The wear kinetics of NaCl under dry nitrogen and at low humidities

Chemical Physics Letters

Volumn 410, Issue 1-3, 2005, Pages 151-155

  Sheehan, P E ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; NITROGEN; REACTION KINETICS; SHEAR STRENGTH; TEMPERATURE DISTRIBUTION; WEAR OF MATERIALS;

ATOMIC FORCE MICROSCOPES; PROBE TIPS; WEAR KINETICS; WEAR RATE;

SODIUM CHLORIDE;

EID: 20444450170     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2005.05.060     Document Type: Article

References (28)

1. G.V. Dedkov Phys. Status Solidi A 179 2000 3
2. B. Bhushan Handbook of micro/nano tribology 1998 CRC Press Boca Raton
3. R.J. Colton J. Vac. Sci. Technol. A 22 2004 1609
4. L. Xu, H. Bluhm, and M. Salmeron Surf. Sci. 407 1998 251
5. G. Meyer, and N.M. Amer Appl. Phys. Lett. 56 1990 2100
6. L. Howald, R. Lüthi, E. Meyer, G. Gerth, H.G. Haefke, R. Overney, and H.-J. Güntherodt J. Vac. Sci. Technol. A 12 1994 2227
7. E. Meyer, R. Lüthi, L. Howald, W. Gutmannsbauer, H. Haefke, and H.-J. Güntherodt Nanotechnology 7 1996 340
8. H. Shindo, M. Ohashi, K. Baba, and A. Seo Surf. Sci. 358 1996 111
9. D. Maugis Contact adhesion and rupture of elastic solids 2000 Springer-Verlag Berlin
10. J.T. Dickinson, N.-S. Park, M.-W. Kim, and S.C. Langford Tribol. Lett. 3 1997 69
11. J.A. Zimmerman, C.L. Kelchner, P.A. Klein, J.C. Hamilton, and S.M. Foiles Phys. Rev. Lett. 8716 2001 165507
12. J.D. Kiely, R.Q. Hwang, and J.E. Houston Phys. Rev. Lett. 81 1998 4424
13. K.L. Johnson, and J.A. Greenwood J. Colloids Interface Sci. 192 1997 326
14. N.S. Park, M.W. Kim, S.C. Langford, and J.T. Dickinson J. Appl. Phys. 80 1996 2680
15. S.N. Zhurkov Int. J. Fract. Mech. 1 1965 311
16. W.C. Mackrodt, and R.F. Stewart J. Phys. C 10 1977 1431
17. E. Gnecco, R. Bennewitz, and E. Meyer Phys. Rev. Lett. 88 2002 215501
18. A.L. Shluger, A.L. Rohl, R.T. Williams, and R.M. Wilson Phys. Rev. B 52 1995 11398
19. L. Scudiero, S.C. Langford, and J.T. Dickinson Tribol. Lett. 6 1999 41
20. R.C. Baetzold Phys. Rev. B 52 1995 11424
21. K.H. Nwe, S.C. Langford, J.T. Dickinson, and W.P. Hess J. Appl. Phys. 97 2005
22. R.R. Hudgins, P. Dugourd, J.M. Tenenbaum, and M.F. Jarrold Phys. Rev. Lett. 78 1997 4213
23. M. Binggeli, and C.M. Mate Appl. Phys. Lett. 65 1994 415
24. M. Luna, F. Rieutord, N.A. Melman, Q. Dai, and M. Salmeron J. Phys. Chem. A 102 1998 6793
25. Q. Dai, J. Hu, and M. Salmeron J. Phys. Chem. B 101 1997 1994
26. S. Garcia-Manyes, A. Verdaguer, P. Gorostiza, and F. Sanz J. Chem. Phys. 120 2004 2963
27. S. Rozhok, P. Sun, R. Piner, M. Lieberman, and C.A. Mirkin J. Phys. Chem. B 108 2004 7814
28. The configuration of the AFM does not allow the temperature and the relative humidity to be measured at the same location. Because relative humidity is a function of temperature, and because the thermometer and hygrometer are not colocated, it is not possible to measure accurately the relative humidity at elevated temperatures.