Atomic-force-microscope study of contact area and friction on

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 16, 1997, Pages 10776-10785

  Lantz, M ^a   O'Shea S ^a   Welland, M ^a   Johnson, K ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b 1 New Square ^*  (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001536906     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.10776     Document Type: Article

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