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Volumn 69, Issue 6, 1997, Pages 1012-1018

Tapping-Mode AFM in Comparison to Contact-Mode AFM as a Tool for in Situ Investigations of Surface Reactions with Reference to Glass Corrosion

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Indexed keywords


EID: 0000913412     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac9607020     Document Type: Article
Times cited : (45)

References (27)
  • 1
    • 0006709441 scopus 로고
    • Frenzel G. Sci. Am. 1985, 252 (5), 100-106.
    • (1985) Sci. Am. , vol.252 , Issue.5 , pp. 100-106
    • Frenzel, G.1
  • 12
    • 0000287713 scopus 로고
    • Das, C. R. Glass Ind. 1969, 50, 483-485.
    • (1969) Glass Ind. , vol.50 , pp. 483-485
    • Das, C.R.1
  • 25
    • 85033132034 scopus 로고    scopus 로고
    • Digital Instruments Inc., 520 E. Montecito St., Santa Barbara, CA 93193
    • Digital Instruments Inc., 520 E. Montecito St., Santa Barbara, CA 93193.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.