Toward true surface recovery: Studying distortions in scanning probe microscopy image data

Langmuir

Volumn 12, Issue 14, 1996, Pages 3468-3471

  Williams, P M ^a   Shakesheff, K M ^a   Davies, M C ^a   Jackson, D E ^a   Roberts, C J ^a   Tendler, S J B ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE RECONSTRUCTION; MICROSCOPY; POLYMERS; PROBES; SEMICONDUCTOR MATERIALS; SURFACE PHENOMENA;

DISTORTIONS; SCANNING PROBE MICROSCOPY; SCANNING PROBE SURFACE RECONSTRUCTION;

IMAGE ANALYSIS;

EID: 0030180669     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la940915p     Document Type: Article

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