Cantilever tilt compensation for variable-load atomic force microscopy

Review of Scientific Instruments

Volumn 76, Issue 5, 2005, Pages

  Cannara, Rachel J ^a   Brukman, Matthew J ^a   Carpick, Robert W ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER TILT; CHEMICAL FORCE MICROSCOPY (CFM); FORCE-DISPLACEMENT (FD); NONCONTACT (NC);

ACTUATORS; ELASTICITY; FRICTION; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; SURFACE TREATMENT;

ATOMIC FORCE MICROSCOPY;

EID: 18744387731     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1896624     Document Type: Article

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