Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Volumn , Issue , 2012, Pages

  Haugstad, Greg ^a  

^a NONE

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EID: 84891583301     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9781118360668     Document Type: Book

References (403)

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