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Volumn 9, Issue 19, 2013, Pages 3201-3211

Opportunities in high-speed atomic force microscopy

Author keywords

AFM lithography; atomic force microscopy; high speed AFM; scanning probe microscopy; surface analysis

Indexed keywords

AFM LITHOGRAPHY; HIGH-SPEED AFM; MATERIALS SCIENTIST; NANOMETER RESOLUTIONS; VIDEO RATES;

EID: 84885428929     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201203223     Document Type: Article
Times cited : (40)

References (84)
  • 82
    • 83455172388 scopus 로고    scopus 로고
    • A. A. Tseng, Small 2011, 7, 3409.
    • (2011) Small , vol.7 , pp. 3409
    • Tseng, A.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.