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Review of Scientific Instruments

Volumn 76, Issue 5, 2005, Pages

Active damping of the scanner for high-speed atomic force microscopy

(3) Kodera, Noriyuki a Yamashita, Hayato a Ando, Toshio a

a KANAZAWA UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK CIRCUITS; MECHANICAL RESONANCE; PHASE COMPENSATION; TRANSIENT RESPONSE;

ACTUATORS; BANDWIDTH; DAMPING; IMAGING TECHNIQUES; MACROMOLECULES; NATURAL FREQUENCIES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; RESONANCE; TRANSFER FUNCTIONS;

ATOMIC FORCE MICROSCOPY;

EID: 18744378027 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1903123 Document Type: Article

Times cited : (171)

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