Improved atomic force microscope cantilever performance by ion beam modification

Review of Scientific Instruments

Volumn 72, Issue 10, 2001, Pages 3880-3883

  Hodges, Alex R ^a   Bussmann, Konrad M ^b   Hoh, Jan H ^a,c  

^a JOHNS HOPKINS UNIVERSITY SCHOOL OF MEDICINE   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035471786     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1405799     Document Type: Article

References (11)

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