SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 110, Issue 7, 2010, Pages 826-830

Real-time atomic force microscopy in lubrication condition

(6) Lee, Hyunsoo a Lee, Donghyeok a Kim, K B a Seo, Yongho a Kim, Hyunsook b Lee, Haiwon b

a Sejong University (South Korea)

b Hanyang University (South Korea)

Author keywords

AFM; Atomic force microscopy; Fast scanning; Lubrication condition; Real time; Tip modification

Indexed keywords

AFM; FAST SCANNING; FRICTION AND WEAR; FRICTIONAL FORCES; HYDROPHOBIC FILM; LUBRICATION CONDITION; LUBRICIOUS SURFACES; MECHANICAL SCANNER; SAMPLE SURFACE; WEAR PROBLEMS;

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; FRICTION; HYDROCARBONS; IMAGE QUALITY; LUBRICATION; MINERAL OILS; SCANNING;

ATOMS;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; FRICTION; HYDROPHOBICITY; IMAGE QUALITY; LUBRICATION; MECHANICAL STRESS; PROCESS DEVELOPMENT; SURFACE PROPERTY;

EID: 77953542375 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2010.02.045 Document Type: Article

Times cited : (3)

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