Software for drift compensation, particle tracking and particle analysis of high-speed atomic force microscopy image series

Journal of Molecular Recognition

Volumn 25, Issue 5, 2012, Pages 292-298

  Husain, Mohamed ^a   Boudier, Thomas ^b   Paul Gilloteaux, Perrine ^c   Casuso, Ignacio ^a   Scheuring, Simon ^a  

^a Université Aix Marseille   (France)

^b SORBONNE UNIVERSITÉ   (France)

^c INSTITUT CURIE   (France)

Author keywords

analysis software; high speed AFM

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER PROGRAM; CONFERENCE PAPER; IMAGE PROCESSING; INSTRUMENTATION;

IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY, ATOMIC FORCE; SOFTWARE;

EID: 84860325548     PISSN: 09523499     EISSN: 10991352     Source Type: Journal    
DOI: 10.1002/jmr.2187     Document Type: Conference Paper

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