메뉴 건너뛰기




Volumn 82, Issue 4, 2011, Pages

Experimental observation of contact mode cantilever dynamics with nanosecond resolution

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONTACT MODES; EIGEN MODES; EXPERIMENTAL OBSERVATION; HIGH DENSITY; HIGHER ORDER; LASER DOPPLER VIBROMETERS; LINE SCAN; MEASUREMENT POINTS; MICA SURFACES; NANOSECOND RESOLUTION; QUANTITATIVE MEASUREMENT; TIP-SAMPLE INTERACTION;

EID: 79955571619     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3575321     Document Type: Article
Times cited : (27)

References (26)
  • 2
    • 0033726176 scopus 로고    scopus 로고
    • 10.1016/S0039-6028(00)00378-2
    • Robert W. Stark and W. M. Heckl, Surf Sci. 457 (1-2), 219 (2000). 10.1016/S0039-6028(00)00378-2
    • (2000) Surf Sci. , vol.457 , Issue.12 , pp. 219
    • Stark, R.W.1    Heckl, W.M.2
  • 7
    • 39749095028 scopus 로고    scopus 로고
    • Cantilever dynamics in atomic force microscopy
    • DOI 10.1016/S1748-0132(08)70012-4, PII S1748013208700124
    • A. Raman, J. Melcher, and R. Tung, Nanotoday 3 (1-2), 20 (2008). 10.1016/S1748-0132(08)70012-4 (Pubitemid 351298585)
    • (2008) Nano Today , vol.3 , Issue.1-2 , pp. 20-27
    • Raman, A.1    Melcher, J.2    Tung, R.3
  • 8
    • 34249889315 scopus 로고    scopus 로고
    • Nanoscale compositional mapping with gentle forces
    • DOI 10.1038/nmat1925, PII NMAT1925
    • R. Garcia, R. Magerle, and R. Perez, Nature Mater. 6 (6), 405 (2007). 10.1038/nmat1925 (Pubitemid 46869990)
    • (2007) Nature Materials , vol.6 , Issue.6 , pp. 405-411
    • Garcia, R.1    Magerle, R.2    Perez, R.3
  • 9
    • 33748689566 scopus 로고    scopus 로고
    • Multifrequency, repulsive-mode amplitude-modulated atomic force microscopy
    • DOI 10.1063/1.2345593
    • R. Proksch, Appl Phys Lett. 89 (11), 113121 (2006). 10.1063/1.2345593 (Pubitemid 44396640)
    • (2006) Applied Physics Letters , vol.89 , Issue.11 , pp. 113121
    • Proksch, R.1
  • 11
    • 15544385340 scopus 로고    scopus 로고
    • A new atomic force microscopy based technique for studying nanoscale friction at high sliding velocities
    • DOI 10.1088/0022-3727/38/5/015
    • N. Tambe and B. Bhushan, J. Phys. D: Appl. Phys. 38, 764 (2005). 10.1088/0022-3727/38/5/015 (Pubitemid 40402048)
    • (2005) Journal of Physics D: Applied Physics , vol.38 , Issue.5 , pp. 764-773
    • Tambe, N.S.1    Bhushan, B.2
  • 12
    • 33750504060 scopus 로고    scopus 로고
    • New technique for studying nanoscale friction at sliding velocities up to 200 mms using atomic force microscope
    • DOI 10.1063/1.2358690
    • Z. Tao and B. Bhushan, Rev. Sci. Instrum. 77, 103705 (2006). 10.1063/1.2358690 (Pubitemid 44664932)
    • (2006) Review of Scientific Instruments , vol.77 , Issue.10 , pp. 103705
    • Tao, Z.1    Bhushan, B.2
  • 14
    • 36549096102 scopus 로고
    • 10.1063/1.100061
    • G. Meyer and N. Amer, Appl. Phys. Lett. 53 (12), 1045 (1988). 10.1063/1.100061
    • (1988) Appl. Phys. Lett. , vol.53 , Issue.12 , pp. 1045
    • Meyer, G.1    Amer, N.2
  • 16
    • 79955602059 scopus 로고    scopus 로고
    • See for information on the vibrometer used.
    • See http://www.polytec.com/uk for information on the vibrometer used.
  • 18
    • 0035538383 scopus 로고    scopus 로고
    • 10.1002/1521-3927(20010901)22:13989::AID-MARC9893.0.CO;2-D
    • T. Hugel and M. Seitz, Macromol. Rapid Commun. 22 (13), 989 (2001). 10.1002/1521-3927(20010901)22:13989::AID-MARC9893.0.CO;2-D
    • (2001) Macromol. Rapid Commun. , vol.22 , Issue.13 , pp. 989
    • Hugel, T.1    Seitz, M.2
  • 24
    • 79955630460 scopus 로고    scopus 로고
    • Contact author for further information
    • Contact author for further information.
  • 26
    • 65349124738 scopus 로고    scopus 로고
    • 10.1088/0957-4484/20/6/065702
    • J. L. Choi and D. T. Gethin, Nanotechnology 20 (6), 065702 (2009). 10.1088/0957-4484/20/6/065702
    • (2009) Nanotechnology , vol.20 , Issue.6 , pp. 065702
    • Choi, J.L.1    Gethin, D.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.