Real-time atomic force microscopy using mechanical resonator type scanner

Review of Scientific Instruments

Volumn 79, Issue 10, 2008, Pages

  Seo, Yongho ^a   Choi, C S ^b   Han, S H ^b   Han, Seung Jin ^b  

^a Sejong University   (South Korea)

^b Doosan Mecatec Co Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ETHYLENE; IMAGE ACQUISITION; RESONANCE; RESONATORS; SCANNING; VIBRATIONS (MECHANICAL);

ATOMIC FORCE MICROSCOPES; ATOMIC FORCES; BIOLOGICAL SAMPLES; DIRECTIONAL MOTIONS; MECHANICAL RESONATORS; RESEARCH FIELDS; RESONANCE FREQUENCIES; RESONANT VIBRATIONS; SEQUENTIAL IMAGES;

ATOMS;

ALUMINUM SILICATE; LEAD; MACROGOL DERIVATIVE; MICA; SILICON DERIVATIVE; SILICON NITRIDE; TITANIUM; ZIRCONIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ENZYME SPECIFICITY; EQUIPMENT DESIGN; METHODOLOGY; TIME; VIBRATION; VISCOSITY;

ALUMINUM SILICATES; EQUIPMENT DESIGN; LEAD; MICROSCOPY, ATOMIC FORCE; POLYETHYLENE GLYCOLS; SILICON COMPOUNDS; SUBSTRATE SPECIFICITY; TIME FACTORS; TITANIUM; VIBRATION; VISCOSITY; ZIRCONIUM;

EID: 55349133385     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2999579     Document Type: Conference Paper

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