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Volumn , Issue , 2008, Pages 3194-3200

Control techniques in high-speed atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; EXTREME ULTRAVIOLET LITHOGRAPHY; MACROMOLECULES; MICROSCOPIC EXAMINATION; MOLECULES; SCANNING PROBE MICROSCOPY; SPEED; SUPRAMOLECULAR CHEMISTRY; VISUALIZATION;

EID: 52449107368     PISSN: 07431619     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ACC.2008.4586984     Document Type: Conference Paper
Times cited : (24)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.