High-speed atomic force microscopy in slow motion - Understanding cantilever behaviour at high scan velocities

Nanotechnology

Volumn 23, Issue 20, 2012, Pages

  Payton, O D ^a   Picco, L ^a   Robert, D ^a   Raman, A ^b   Homer, M E ^a   Champneys, A R ^a   Miles, M J ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE IMAGES; CONTACT MODES; DISPLACEMENT DETECTION; EIGEN MODES; HIGH-SPEED; IMAGE ARTEFACTS; SCAN VELOCITY; SCANNING LASER DOPPLER VIBROMETERS; SLOW MOTION;

ATOMIC FORCE MICROSCOPY;

NANOCANTILEVERS;

NANOPARTICLE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; IMAGE QUALITY; METHODOLOGY; ULTRASTRUCTURE; VIBRATION; VIDEORECORDING;

IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY, ATOMIC FORCE; NANOPARTICLES; PHANTOMS, IMAGING; VIBRATION; VIDEO RECORDING;

EID: 84860535044     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/20/205704     Document Type: Article

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