Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells

Volumn , Issue , 2011, Pages 275-298

  Sadewasser, Sascha ^a   Visoly Fisher, Iris ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

Atomic force microscopy (AFM); Kelvin probe force microscope (KPFM); Phase locked loop (PLL); Scanning capacitance microscopy (SCM); Scanning spreading resistance microscopy (SSRM); Tip sample interaction

Indexed keywords

EID: 84882714841     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527636280.ch11     Document Type: Chapter

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