A Σ3 grain boundary in an epitaxial chalcopyrite film

Thin Solid Films

Volumn 515, Issue 15 SPEC. ISS., 2007, Pages 6168-6171

  Siebentritt, Susanne ^a,b   Eisenbarth, Tobias ^a   Wimmer, Mark ^a   Leendertz, Caspar ^a   Streicher, Ferdinand ^a   Sadewasser, Sascha ^a   Lux Steiner, Martha Ch ^a,b  

^a HAHN MEITNER INSTITUT   (Germany)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Chalcopyrites; Electrical transport; Grain boundary; Kelvin probe force microscopy

Indexed keywords

GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PYRITES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; VAPOR PHASE EPITAXY;

CHALCOPYRITES; CUBIC GAAS SUBSTRATES; HALL MEASUREMENTS; KELVIN PROBE FORCE MICROSCOPY; NEUTRAL GRAIN BOUNDARIES;

METALLIC FILMS;

EID: 34247396100     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.048     Document Type: Article

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