Study of nano-scale electrical properties of hydrogenated microcrystalline silicon solar cells by conductive atomic force microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 5 A, 2007, Pages 2858-2864

  Shen, Zhenhua ^a   Gotoh, Tamihiro ^b   Eguchi, Mototaka ^a   Yoshida, Norimitsu ^a   Itoh, Takashi ^a   Nonomura, Shuichi ^a  

^a GIFU UNIVERSITY   (Japan)

^b GUNMA UNIVERSITY   (Japan)

Author keywords

C Si:H solar cell; Conductive AFM; Local reverse (leakage) current; Nano scale I V characteristics; Surface topography

Indexed keywords

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; GRAIN BOUNDARIES; LEAKAGE CURRENTS; SOLAR CELLS; SURFACE TOPOGRAPHY; X RAY DIFFRACTION;

CONDUCTIVE ATOMIC FORCE MICROSCOPE; LOCAL REVERSE (LEAKAGE) CURRENT;

MICROCRYSTALLINE SILICON;

EID: 34547909629     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.2858     Document Type: Article

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